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Yoichi Kawada
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Shizuoka, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Optical element for terahertz waves and manufacturing method of the...
Patent number
11,320,569
Issue date
May 3, 2022
Hamamatsu Photonics K.K.
Yoichi Kawada
G02 - OPTICS
Information
Patent Grant
Wave plate and divided prism member
Patent number
10,908,355
Issue date
Feb 2, 2021
HAMAMATSU PHOTONICS K.K.
Yoichi Kawada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Terahertz wave spectroscopic measurement apparatus and terahertz wa...
Patent number
10,895,504
Issue date
Jan 19, 2021
Hamamatsu Photonics K.K.
Takashi Yasuda
G01 - MEASURING TESTING
Information
Patent Grant
Optical measurement device and optical measurement method
Patent number
10,809,189
Issue date
Oct 20, 2020
Hamamatsu Photonics K.K.
Kazuki Horita
G01 - MEASURING TESTING
Information
Patent Grant
Optical analysis device and optical analysis method
Patent number
10,670,520
Issue date
Jun 2, 2020
Hamamatsu Photonics K.K.
Yoichi Kawada
G01 - MEASURING TESTING
Information
Patent Grant
Wave plate and divided prism member
Patent number
10,591,669
Issue date
Mar 17, 2020
Hamamatsu Photonics K.K.
Yoichi Kawada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Tunnel current control apparatus and tunnel current control method
Patent number
10,591,509
Issue date
Mar 17, 2020
Hamamatsu Photonics K.K.
Yoichi Kawada
G01 - MEASURING TESTING
Information
Patent Grant
Tunnel current control apparatus and tunnel current control method
Patent number
10,451,651
Issue date
Oct 22, 2019
Hamamatsu Photonics K.K.
Yoichi Kawada
G01 - MEASURING TESTING
Information
Patent Grant
Non-linear optical crystal and method for manufacturing same, and t...
Patent number
10,248,003
Issue date
Apr 2, 2019
Hamamatsu Photonics K.K.
Kouichiro Akiyama
C07 - ORGANIC CHEMISTRY
Information
Patent Grant
Wavelength conversion element and wavelength conversion light pulse...
Patent number
10,082,720
Issue date
Sep 25, 2018
Hamamatsu Photonics K.K.
Hisanari Takahashi
G02 - OPTICS
Information
Patent Grant
Total reflection spectroscopic measurement device and total reflect...
Patent number
10,048,129
Issue date
Aug 14, 2018
Hamamatsu Photonics K.K.
Yoichi Kawada
G01 - MEASURING TESTING
Information
Patent Grant
Spectroscopic measurement apparatus
Patent number
9,927,298
Issue date
Mar 27, 2018
Hamamatsu Photonics K.K.
Yoichi Kawada
G01 - MEASURING TESTING
Information
Patent Grant
Terahertz-wave spectrometer
Patent number
9,696,206
Issue date
Jul 4, 2017
Hamamatsu Photonics K.K.
Takashi Yasuda
G01 - MEASURING TESTING
Information
Patent Grant
Electric field vector detection method and electric field vector de...
Patent number
9,612,153
Issue date
Apr 4, 2017
Hamamatsu Photonics K.K.
Yoichi Kawada
G01 - MEASURING TESTING
Information
Patent Grant
Prism member, terahertz-wave spectroscopic measurement device, and...
Patent number
9,417,182
Issue date
Aug 16, 2016
Hamamatsu Photonics K.K.
Kouichiro Akiyama
G01 - MEASURING TESTING
Information
Patent Grant
Drug evaluation method and drug evaluation device
Patent number
9,157,851
Issue date
Oct 13, 2015
Hamamatsu Photonics K.K.
Gen Takebe
G01 - MEASURING TESTING
Information
Patent Grant
Drug evaluation method and drug evaluation device
Patent number
9,128,041
Issue date
Sep 8, 2015
HAMAMATSU PHOTONICS K.K.
Gen Takebe
G01 - MEASURING TESTING
Information
Patent Grant
Terahertz-wave spectrometer and prism member
Patent number
9,080,913
Issue date
Jul 14, 2015
Hamamatsu Photonics K.K.
Takashi Yasuda
G01 - MEASURING TESTING
Information
Patent Grant
Electromagnetic wave detection device
Patent number
8,993,967
Issue date
Mar 31, 2015
Hamamatsu Photonics K.K.
Yoichi Kawada
G01 - MEASURING TESTING
Information
Patent Grant
Optical amplifying device
Patent number
8,947,771
Issue date
Feb 3, 2015
Hamamatsu Photonics K.K.
Koei Yamamoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Pulse-width converting apparatus and optical amplifying system
Patent number
8,797,641
Issue date
Aug 5, 2014
Hamamatsu Photonics K.K.
Masatoshi Fujimoto
G02 - OPTICS
Information
Patent Grant
Single terahertz wave time-waveform measuring device
Patent number
8,742,353
Issue date
Jun 3, 2014
Hamamatsu Photonics K.K.
Yoichi Kawada
G01 - MEASURING TESTING
Information
Patent Grant
Terahertz wave generation device
Patent number
8,564,875
Issue date
Oct 22, 2013
Hamamatsu Photonics K.K.
Yoichi Kawada
G02 - OPTICS
Information
Patent Grant
Total reflection terahertz wave measurement device
Patent number
8,415,625
Issue date
Apr 9, 2013
Hamamatsu Photonics K.K.
Atsushi Nakanishi
G01 - MEASURING TESTING
Information
Patent Grant
Total reflection tera hertz wave measuring apparatus
Patent number
8,354,644
Issue date
Jan 15, 2013
Hamamatsu Photonics K.K.
Takashi Yasuda
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
OPTICAL ELEMENT
Publication number
20230130965
Publication date
Apr 27, 2023
HAMAMATSU PHOTONICS K. K.
Yoichi KAWADA
G02 - OPTICS
Information
Patent Application
SPECTROSCOPIC MEASUREMENT DEVICE
Publication number
20220404274
Publication date
Dec 22, 2022
HAMAMATSU PHOTONICS K. K.
Takayoshi KUGA
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL ELEMENT
Publication number
20210041600
Publication date
Feb 11, 2021
HAMAMATSU PHOTONICS K. K.
Yoichi KAWADA
G02 - OPTICS
Information
Patent Application
WAVE PLATE AND DIVIDED PRISM MEMBER
Publication number
20200150339
Publication date
May 14, 2020
HAMAMATSU PHOTONICS K. K.
Yoichi KAWADA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
OPTICAL ELEMENT FOR TERAHERTZ WAVES AND MANUFACTURING METHOD OF THE...
Publication number
20200103557
Publication date
Apr 2, 2020
HAMAMATSU PHOTONICS K. K.
Yoichi KAWADA
G02 - OPTICS
Information
Patent Application
OPTICAL MEASUREMENT DEVICE AND OPTICAL MEASUREMENT METHOD
Publication number
20190271642
Publication date
Sep 5, 2019
HAMAMATSU PHOTONICS K. K.
Kazuki HORITA
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL ANALYSIS DEVICE AND OPTICAL ANALYSIS METHOD
Publication number
20190154574
Publication date
May 23, 2019
HAMAMATSU PHOTONICS K. K.
Yoichi KAWADA
G01 - MEASURING TESTING
Information
Patent Application
TUNNEL CURRENT CONTROL APPARATUS AND TUNNEL CURRENT CONTROL METHOD
Publication number
20190064209
Publication date
Feb 28, 2019
HAMAMATSU PHOTONICS K. K.
Yoichi KAWADA
G01 - MEASURING TESTING
Information
Patent Application
TUNNEL CURRENT CONTROL APPARATUS AND TUNNEL CURRENT CONTROL METHOD
Publication number
20190064210
Publication date
Feb 28, 2019
HAMAMATSU PHOTONICS K. K.
Yoichi KAWADA
G01 - MEASURING TESTING
Information
Patent Application
TERAHERTZ WAVE SPECTROSCOPIC MEASUREMENT APPARATUS AND TERAHERTZ WA...
Publication number
20190025124
Publication date
Jan 24, 2019
HAMAMATSU PHOTONICS K. K.
Takashi YASUDA
G01 - MEASURING TESTING
Information
Patent Application
WAVELENGTH CONVERSION ELEMENT AND WAVELENGTH CONVERSION LIGHT PULSE...
Publication number
20180067376
Publication date
Mar 8, 2018
HAMAMATSU PHOTONICS K. K.
Hisanari TAKAHASHI
G02 - OPTICS
Information
Patent Application
TOTAL REFLECTION SPECTROSCOPIC MEASUREMENT DEVICE AND TOTAL REFLECT...
Publication number
20170336259
Publication date
Nov 23, 2017
HAMAMATSU PHOTONICS K. K.
Yoichi KAWADA
G01 - MEASURING TESTING
Information
Patent Application
NON-LINEAR OPTICAL CRYSTAL AND METHOD FOR MANUFACTURING SAME, AND T...
Publication number
20170248833
Publication date
Aug 31, 2017
Hamamatsu Photonics K.K.
Kouichiro Akiyama
G02 - OPTICS
Information
Patent Application
SPECTROSCOPIC MEASUREMENT APPARATUS
Publication number
20160313182
Publication date
Oct 27, 2016
HAMAMATSU PHOTONICS K. K.
Yoichi KAWADA
G01 - MEASURING TESTING
Information
Patent Application
WAVE PLATE AND DIVIDED PRISM MEMBER
Publication number
20160154176
Publication date
Jun 2, 2016
Hamamatsu Photonics K. K.
Yoichi KAWADA
G02 - OPTICS
Information
Patent Application
ELECTRIC FIELD VECTOR DETECTION METHOD AND ELECTRIC FIELD VECTOR DE...
Publication number
20160146666
Publication date
May 26, 2016
HAMAMATSU PHOTONICS K. K.
Yoichi KAWADA
G01 - MEASURING TESTING
Information
Patent Application
PRISM MEMBER, TERAHERTZ-WAVE SPECTROSCOPIC MEASUREMENT DEVICE, AND...
Publication number
20150136986
Publication date
May 21, 2015
Hamamatsu Photonics K.K.
Kouichiro Akiyama
G01 - MEASURING TESTING
Information
Patent Application
TERAHERTZ-WAVE SPECTROMETER
Publication number
20140014840
Publication date
Jan 16, 2014
Hamamatsu Photonics K.K.
Takashi Yasuda
G01 - MEASURING TESTING
Information
Patent Application
TOTAL REFLECTION SPECTROSCOPIC MEASUREMENT METHOD
Publication number
20140008541
Publication date
Jan 9, 2014
Hamamatsu Photonics K.K.
Kouichiro Akiyama
G01 - MEASURING TESTING
Information
Patent Application
TERAHERTZ-WAVE SPECTROMETER AND PRISM MEMBER
Publication number
20140008540
Publication date
Jan 9, 2014
Hamamatsu Photonics K.K.
Takashi Yasuda
G01 - MEASURING TESTING
Information
Patent Application
DRUG EVALUATION METHOD AND DRUG EVALUATION DEVICE
Publication number
20130187050
Publication date
Jul 25, 2013
HAMAMATSU PHOTONICS K. K.
Gen TAKEBE
G01 - MEASURING TESTING
Information
Patent Application
ELECTROMAGNETIC WAVE DETECTION DEVICE
Publication number
20120326041
Publication date
Dec 27, 2012
Hamamatsu Photonics K.K.
Yoichi Kawada
G01 - MEASURING TESTING
Information
Patent Application
PULSE-WIDTH CONVERTING APPARATUS AND OPTICAL AMPLIFYING SYSTEM
Publication number
20120147457
Publication date
Jun 14, 2012
HAMAMATSU PHOTONICS K. K.
Masatoshi Fujimoto
G02 - OPTICS
Information
Patent Application
TOTAL REFLECTION TERAHERTZ WAVE MEASUREMENT DEVICE
Publication number
20110249253
Publication date
Oct 13, 2011
HAMAMATSU PHOTONICS K. K.
Atsushi Nakanishi
G01 - MEASURING TESTING
Information
Patent Application
TERAHERTZ WAVE GENERATION DEVICE
Publication number
20110242642
Publication date
Oct 6, 2011
HAMAMATSU PHOTONICS K. K.
Yoichi Kawada
G02 - OPTICS
Information
Patent Application
OPTICAL ELEMENT, LASER BEAM OSCILLATION DEVICE AND LASER BEAM AMPLI...
Publication number
20110222289
Publication date
Sep 15, 2011
National Institute of Advanced Industrial Science and Technology
Koei Yamamoto
G02 - OPTICS
Information
Patent Application
OPTICAL AMPLIFYING DEVICE
Publication number
20100091359
Publication date
Apr 15, 2010
Koei Yamamoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SINGLE TERAHERTZ WAVE TIME-WAVEFORM MEASURING DEVICE
Publication number
20100090112
Publication date
Apr 15, 2010
HAMAMATSU PHOTONICS K.K.
Yoichi Kawada
G01 - MEASURING TESTING
Information
Patent Application
TOTAL REFLECTION TERA HERTZ WAVE MEASURING APPARATUS
Publication number
20100091266
Publication date
Apr 15, 2010
Hamamatsu Photonics K.K.
Takashi Yasuda
G01 - MEASURING TESTING