Yoichi Maeda

Follow

Person

Kanagawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor integrated circuit and method for designing the same
- Patent number 9,086,451
- Issue date Jul 21, 2015
- Renesas Electronics Corporation
- Hiroki Wada
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD FOR DESIGNING THE SAME
- Publication number 20130328583
- Publication date Dec 12, 2013
- Hiroki Wada
- G01 - MEASURING TESTING