Yoichi Maeda

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and method of controlling self-diagnosis
- Patent number 11,255,907
- Issue date Feb 22, 2022
- Renesas Electronics Corporation
- Yoshinori Nishida
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and diagnostic method therefor
- Patent number 10,580,513
- Issue date Mar 3, 2020
- Renesas Electronics Corporation
- Yoichi Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device and diagnosis method thereof
- Patent number 10,504,609
- Issue date Dec 10, 2019
- Renesas Electronics Corporation
- Yoichi Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device and scan test method including writing and rea...
- Patent number 10,295,597
- Issue date May 21, 2019
- Renesas Electronics Corporation
- Yoichi Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device, electronic control system and method for eval...
- Patent number 10,288,683
- Issue date May 14, 2019
- Renesas Electronics Corporation
- Yoichi Maeda
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and diagnostic test method for both single-poi...
- Patent number 10,281,525
- Issue date May 7, 2019
- Renesas Electronics Corporation
- Yoichi Maeda
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 10,254,342
- Issue date Apr 9, 2019
- Renesas Electronics Corporation
- Yoichi Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Speaker system
- Patent number 4,131,180
- Issue date Dec 26, 1978
- Trio Kabushiki Kaisha
- Yoichi Maeda
- G10 - MUSICAL INSTRUMENTS ACOUSTICS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF CONTROLLING SELF-DIAGNOSIS
- Publication number 20200072903
- Publication date Mar 5, 2020
- RENESAS ELECTRONICS CORPORATION
- Yoshinori NISHIDA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND DIAGNOSTIC METHOD THEREFOR
- Publication number 20180277237
- Publication date Sep 27, 2018
- RENESAS ELECTRONICS CORPORATION
- Yoichi MAEDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE AND DIAGNOSTIC TEST METHOD
- Publication number 20180180672
- Publication date Jun 28, 2018
- Renesas Electric Corporation
- Yoichi MAEDA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND DIAGNOSIS METHOD THEREOF
- Publication number 20180090225
- Publication date Mar 29, 2018
- RENESAS ELECTRONICS CORPORATION
- Yoichi MAEDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE AND SCAN TEST METHOD
- Publication number 20180059183
- Publication date Mar 1, 2018
- RENESAS ELECTRONICS CORPORATION
- Yoichi MAEDA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE, ELECTRONIC CONTROL SYSTEM AND METHOD FOR EVAL...
- Publication number 20170343607
- Publication date Nov 30, 2017
- RENESAS ELECTRONICS CORPORATION
- Yoichi MAEDA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20170285106
- Publication date Oct 5, 2017
- RENESAS ELECTRONICS CORPORATION
- Yoichi MAEDA
- G01 - MEASURING TESTING
Information Patent Application
VIDEO REPRODUCING APPARATUS
- Publication number 20080143889
- Publication date Jun 19, 2008
- Nikko Co., Ltd.
- Kenji MUKAIDA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Yoichi Maeda

Person

Patents Grantslast 30 patents

Semiconductor device and method of controlling self-diagnosis

Semiconductor device and diagnostic method therefor

Semiconductor device and diagnosis method thereof

Semiconductor device and scan test method including writing and rea...

Semiconductor device, electronic control system and method for eval...

Semiconductor device and diagnostic test method for both single-poi...

Semiconductor device

Speaker system

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE AND METHOD OF CONTROLLING SELF-DIAGNOSIS

SEMICONDUCTOR DEVICE AND DIAGNOSTIC METHOD THEREFOR

SEMICONDUCTOR DEVICE AND DIAGNOSTIC TEST METHOD

SEMICONDUCTOR DEVICE AND DIAGNOSIS METHOD THEREOF

SEMICONDUCTOR DEVICE AND SCAN TEST METHOD

SEMICONDUCTOR DEVICE, ELECTRONIC CONTROL SYSTEM AND METHOD FOR EVAL...

SEMICONDUCTOR DEVICE

VIDEO REPRODUCING APPARATUS