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Gas solution manufacturing device
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Patent number 11,648,515
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Issue date May 16, 2023
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Ebara Corporation
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Suguru Ozawa
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B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Plating apparatus and plating method
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Patent number 11,047,063
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Issue date Jun 29, 2021
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Ebara Corporation
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Jumpei Fujikata
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C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
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Gas solution production apparatus
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Patent number 10,710,030
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Issue date Jul 14, 2020
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Ebara Corporation
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Yoichi Nakagawa
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C02 - TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
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Plating apparatus and plating method
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Patent number 10,294,578
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Issue date May 21, 2019
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Ebara Corporation
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Jumpei Fujikata
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C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
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Radar device
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Patent number 9,880,276
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Issue date Jan 30, 2018
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Panasonic Corporation
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Tadashi Morita
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G01 - MEASURING TESTING
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Radar device
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Patent number 9,664,777
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Issue date May 30, 2017
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PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
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Takaaki Kishigami
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G01 - MEASURING TESTING
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Radar apparatus
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Patent number 9,500,741
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Issue date Nov 22, 2016
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Panasonic Corporation
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Takaaki Kishigami
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G01 - MEASURING TESTING
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Radar device
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Patent number 9,448,303
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Issue date Sep 20, 2016
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PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
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Takaaki Kishigami
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G01 - MEASURING TESTING
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Radar Device
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Patent number 9,389,309
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Issue date Jul 12, 2016
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Panasonic Corporation
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Yoichi Nakagawa
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G01 - MEASURING TESTING
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Radar device
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Patent number 9,239,378
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Issue date Jan 19, 2016
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PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
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Takaaki Kishigami
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G01 - MEASURING TESTING