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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Magnetic rotational-angle detector
Patent number
8,134,359
Issue date
Mar 13, 2012
Mitsubishi Electric Corporation
Hiroshi Nishizawa
G01 - MEASURING TESTING
Information
Patent Grant
Optical encoder applying substantially parallel light beams and thr...
Patent number
7,589,314
Issue date
Sep 15, 2009
Mitsubishi Denki Kabushiki Kaisha
Toru Oka
G01 - MEASURING TESTING
Information
Patent Grant
Optical encoder having a no track portion of an optical scale being...
Patent number
7,538,313
Issue date
May 26, 2009
Mitsubishi Denki Kabushiki Kaisha
Toru Oka
G01 - MEASURING TESTING
Information
Patent Grant
Optical encoder
Patent number
7,470,892
Issue date
Dec 30, 2008
Mitsubishi Denki Kabushiki Kaisha
Yoichi Ohmura
G01 - MEASURING TESTING
Information
Patent Grant
Optical rotary encoder
Patent number
7,405,392
Issue date
Jul 29, 2008
Mitsubishi Electric Corporation
Takeshi Musha
G01 - MEASURING TESTING
Information
Patent Grant
Optical encoder with reduced reflected light error having a light n...
Patent number
7,285,769
Issue date
Oct 23, 2007
Mitsubishi Denki Kabushiki Kaisha
Toru Oka
G01 - MEASURING TESTING
Information
Patent Grant
Optical rotary encoder
Patent number
7,034,282
Issue date
Apr 25, 2006
Mitsubishi Denki Kabushiki Kaisha
Toru Oka
G01 - MEASURING TESTING
Information
Patent Grant
Photoelectric rotary encoder
Patent number
6,972,402
Issue date
Dec 6, 2005
Mitsubishi Denki Kabushiki Kaisha
Yoichi Ohmura
G01 - MEASURING TESTING
Information
Patent Grant
Phase-shift photoelectric encoder
Patent number
6,956,200
Issue date
Oct 18, 2005
Mitsubishi Denki Kabushiki Kaisha
Yoichi Ohmura
G01 - MEASURING TESTING
Information
Patent Grant
Absolute-value encoder device
Patent number
6,323,786
Issue date
Nov 27, 2001
Mitsubishi Denki Kabushiki Kaisha
Hirokazu Sakuma
G01 - MEASURING TESTING
Information
Patent Grant
Position detecting apparatus
Patent number
6,232,595
Issue date
May 15, 2001
Mitsubishi Denki Kabushiki Kaisha
Takashi Okamuro
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MAGNETIC ROTATIONAL-ANGLE DETECTOR
Publication number
20100052664
Publication date
Mar 4, 2010
Mitsubishi Electric Corporation
Hiroshi Nishizawa
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL ENCODER
Publication number
20080277569
Publication date
Nov 13, 2008
Mitsubishi Denki Kabushiki Kaisha
Toru Oka
G01 - MEASURING TESTING
Information
Patent Application
Optical Encoder
Publication number
20080048104
Publication date
Feb 28, 2008
MITSUBISHI DENKI KABUSHIKI KAISHA
Toru Oka
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL ROTARY ENCODER
Publication number
20070272840
Publication date
Nov 29, 2007
Mitsubishi Electric Corporation
Takeshi Musha
G01 - MEASURING TESTING
Information
Patent Application
Optical encoder
Publication number
20070187581
Publication date
Aug 16, 2007
Mitsubishi Denki Kabushiki Kaisha
Yoichi Ohmura
G01 - MEASURING TESTING
Information
Patent Application
Optical encoder
Publication number
20070034786
Publication date
Feb 15, 2007
Mitsubishi Denki Kabushiki Kaisha
Toru Oka
G01 - MEASURING TESTING
Information
Patent Application
Optical rotary encoder
Publication number
20040206894
Publication date
Oct 21, 2004
Mitsubishi Denki Kabushiki Kaisha
Toru Oka
G01 - MEASURING TESTING
Information
Patent Application
Photoelectric encoder
Publication number
20040183000
Publication date
Sep 23, 2004
Mitsubishi Denki Kabushiki Kaisha
Yoichi Ohmura
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Photoelectric rotary encoder
Publication number
20040004181
Publication date
Jan 8, 2004
Mitsubishi Denki Kabushiki Kaisha
Yoichi Ohmura
G01 - MEASURING TESTING