Yoichi Ose

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electron gun and electron microscope
- Patent number 12,217,928
- Issue date Feb 4, 2025
- HITACHI HIGH-TECH CORPORATION
- Hideo Morishita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron gun and electron beam application apparatus
- Patent number 12,165,828
- Issue date Dec 10, 2024
- HITACHI HIGH-TECH CORPORATION
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus
- Patent number 11,784,022
- Issue date Oct 10, 2023
- HITACHI HIGH-TECH CORPORATION
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 11,251,011
- Issue date Feb 15, 2022
- HITACHI HIGH-TECH CORPORATION
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 11,087,947
- Issue date Aug 10, 2021
- HITACHI HIGH-TECH CORPORATION
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron source and electron beam device using the same
- Patent number 10,707,046
- Issue date Jul 7, 2020
- HITACHI HIGH-TECH CORPORATION
- Toshiaki Kusunoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field emission electron source, method for manufacturing same, and...
- Patent number 10,586,674
- Issue date Mar 10, 2020
- Hitachi High-Technologies Corporation
- Toshiaki Kusunoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle-beam device
- Patent number 9,653,256
- Issue date May 16, 2017
- Hitachi High-Technologies Corporation
- Akira Ikegami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion source and ion beam device using same
- Patent number 9,640,360
- Issue date May 2, 2017
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and arithmetic device
- Patent number 9,530,614
- Issue date Dec 27, 2016
- Hitachi High-Technologies Corporation
- Kotoko Urano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope and electron beam detector
- Patent number 9,355,815
- Issue date May 31, 2016
- Hitachi High-Technologies Corporation
- Shin Imamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron gun and charged particle beam device having an aperture wi...
- Patent number 9,293,293
- Issue date Mar 22, 2016
- Hitachi High-Technologies Corporation
- Shun-ichi Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Observation specimen for use in electron microscopy, electron micro...
- Patent number 9,202,668
- Issue date Dec 1, 2015
- Hitachi High-Technologies Corporation
- Takafumi Miwa
- G01 - MEASURING TESTING
Information Patent Grant
Device for correcting diffraction aberration of electron beam
- Patent number 9,123,501
- Issue date Sep 1, 2015
- Hitachi High-Technologies Corporation
- Muneyuki Fukuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle microscope
- Patent number 9,111,716
- Issue date Aug 18, 2015
- Hitachi High-Technologies Corporation
- Shinichi Matsubara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning ion microscope and secondary particle control method
- Patent number 9,058,959
- Issue date Jun 16, 2015
- Hitachi High-Technologies Corporation
- Yoshimi Kawanami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas field ion source and method for using same, ion beam device, an...
- Patent number 8,847,173
- Issue date Sep 30, 2014
- Hitachi High-Technologies Corporation
- Yoshimi Kawanami
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Sample electrification measurement method and charged particle beam...
- Patent number 8,835,844
- Issue date Sep 16, 2014
- Hitachi, Ltd.
- Makoto Ezumi
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope
- Patent number 8,698,080
- Issue date Apr 15, 2014
- Hitachi High-Technologies Corporation
- Noriaki Arai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion microscope
- Patent number 8,455,841
- Issue date Jun 4, 2013
- Hitachi High-Technologies Corporation
- Norihide Saho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope having a monochromator
- Patent number 8,067,733
- Issue date Nov 29, 2011
- Hitachi High-Technologies Corporation
- Wataru Mori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Monochromator and scanning electron microscope using the same
- Patent number 7,838,827
- Issue date Nov 23, 2010
- Hitachi High-Technologies Corporation
- Yoichi Ose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus with aberration corrector
- Patent number 7,825,377
- Issue date Nov 2, 2010
- Hitachi High-Technologies Corporation
- Takeshi Kawasaki
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Sample electrification measurement method and charged particle beam...
- Patent number 7,700,918
- Issue date Apr 20, 2010
- Hitachi, Ltd.
- Makoto Ezumi
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope having a monochromator
- Patent number 7,612,336
- Issue date Nov 3, 2009
- Hitachi High-Technologies Corporation
- Wataru Mori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus and method for production of its specimen c...
- Patent number 7,566,892
- Issue date Jul 28, 2009
- Hitachi High-Technologies Corporation
- Tsuyoshi Inanobe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 7,459,681
- Issue date Dec 2, 2008
- Hitachi High-Technologies Corporation
- Noriaki Arai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus and method for production of its specimen c...
- Patent number 7,435,958
- Issue date Oct 14, 2008
- Hitachi High-Technologies Corporation
- Tsuyoshi Inanobe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focused ion beam apparatus and focused ion beam irradiation method
- Patent number 7,411,192
- Issue date Aug 12, 2008
- Hitachi High-Technologies Corporation
- Koichiro Takeuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and charged particle beam irradiati...
- Patent number 7,408,172
- Issue date Aug 5, 2008
- Hitachi High-Technologies Corporation
- Mitsugu Sato
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ELECTRON BEAM APPLICATION DEVICE
- Publication number 20240161997
- Publication date May 16, 2024
- HITACHI HIGH-TECH CORPORATION
- Takashi OHSHIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE
- Publication number 20240128049
- Publication date Apr 18, 2024
- HITACHI HIGH-TECH CORPORATION
- Katsura TAKAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON GUN AND ELECTRON BEAM APPLICATION APPARATUS
- Publication number 20240120168
- Publication date Apr 11, 2024
- Hitachi High-Tech Corporation
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON GUN AND ELECTRON BEAM APPLICATION DEVICE
- Publication number 20230402246
- Publication date Dec 14, 2023
- HITACHI HIGH-TECH CORPORATION
- Hideo MORISHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM APPLICATION DEVICE
- Publication number 20230335367
- Publication date Oct 19, 2023
- HITACHI HIGH-TECH CORPORATION
- Takashi OHSHIMA
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
ELECTRON GUN AND ELECTRON MICROSCOPE
- Publication number 20220406558
- Publication date Dec 22, 2022
- HITACHI HIGH-TECH CORPORATION
- Hideo MORISHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM APPARATUS
- Publication number 20220165536
- Publication date May 26, 2022
- Hitachi High-Tech Corporation
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE
- Publication number 20200303152
- Publication date Sep 24, 2020
- Hitachi High-Technologies Corporation
- Takashi OHSHIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Source and Electron Beam Device Using the Same
- Publication number 20190385809
- Publication date Dec 19, 2019
- Hitachi High-Technologies Corporation
- Toshiaki KUSUNOKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Field Emission Electron Source, Method for Manufacturing Same, and...
- Publication number 20190066966
- Publication date Feb 28, 2019
- Hitachi High-Technologies Corporation
- Toshiaki KUSUNOKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged-Particle-Beam Device
- Publication number 20160300690
- Publication date Oct 13, 2016
- Hitachi High-Technologies Corporation
- Akira IKEGAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE AND ELECTRON BEAM DETECTOR
- Publication number 20150214002
- Publication date Jul 30, 2015
- Hitachi High-Technologies Corporation
- Shin Imamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE MICROSCOPE
- Publication number 20150083930
- Publication date Mar 26, 2015
- Hitachi High-Technologies Corporation
- Shinichi Matsubara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND ARITHMETIC DEVICE
- Publication number 20150060654
- Publication date Mar 5, 2015
- Hitachi High-Technolgies Corporation
- Kotoko Urano
- G01 - MEASURING TESTING
Information Patent Application
SCANNING ION MICROSCOPE AND SECONDARY PARTICLE CONTROL METHOD
- Publication number 20150048247
- Publication date Feb 19, 2015
- Hitachi High-Technologies Corporation
- Yoshimi Kawanami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCE AND ION BEAM DEVICE USING SAME
- Publication number 20140299768
- Publication date Oct 9, 2014
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OBSERVATION SPECIMEN FOR USE IN ELECTRON MICROSCOPY, ELECTRON MICRO...
- Publication number 20140264018
- Publication date Sep 18, 2014
- Hitachi High-Technologies Corporation
- Takafumi Miwa
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON GUN AND CHARGED PARTICLE BEAM DEVICE
- Publication number 20140197336
- Publication date Jul 17, 2014
- Hitachi High-Technologies Corporation
- Shun-ichi Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE FOR CORRECTING DIFFRACTION ABERRATION OF ELECTRON BEAM
- Publication number 20140124664
- Publication date May 8, 2014
- Hitachi High-Technologies Corporation
- Muneyuki Fukuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Microscope and Ion Microscope
- Publication number 20130126731
- Publication date May 23, 2013
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAS FIELD ION SOURCE AND METHOD FOR USING SAME, ION BEAM DEVICE, AN...
- Publication number 20130119252
- Publication date May 16, 2013
- Yoshimi Kawanami
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
GAS FIELD IONIZATION ION SOURCE, SCANNING CHARGED PARTICLE MICROSCO...
- Publication number 20130087704
- Publication date Apr 11, 2013
- Hitachi High-Technologies Corporation
- Tohru Ishitani
- B82 - NANO-TECHNOLOGY
Information Patent Application
CHARGED PARTICLE MICROSCOPE
- Publication number 20120217391
- Publication date Aug 30, 2012
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION MICROSCOPE
- Publication number 20120097863
- Publication date Apr 26, 2012
- Norihide Saho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample Electrification Measurement Method and Charged Particle Beam...
- Publication number 20100294929
- Publication date Nov 25, 2010
- Makoto Ezumi
- G01 - MEASURING TESTING
Information Patent Application
SCANNING ELECTRON MICROSCOPE HAVING A MONOCHROMATOR
- Publication number 20100044565
- Publication date Feb 25, 2010
- Hitachi High-Technologies Corporation
- Wataru MORI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Gas field ionization ion source, scanning charged particle microsco...
- Publication number 20090152462
- Publication date Jun 18, 2009
- Hitachi High-Technologies Corporation
- Tohru Ishitani
- B82 - NANO-TECHNOLOGY
Information Patent Application
Scanning electron microscope
- Publication number 20090065694
- Publication date Mar 12, 2009
- Noriaki Arai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam apparatus with aberration corrector
- Publication number 20090008551
- Publication date Jan 8, 2009
- Hitachi High-Technologies Corporation
- Takeshi Kawasaki
- B82 - NANO-TECHNOLOGY
Information Patent Application
Monochromator and scanning electron microscope using the same
- Publication number 20080237463
- Publication date Oct 2, 2008
- Yoichi Ose
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Electron gun and electron microscope

Electron gun and electron beam application apparatus

Electron beam apparatus

Electron microscope

Electron microscope

Electron source and electron beam device using the same

Field emission electron source, method for manufacturing same, and...

Charged particle-beam device

Ion source and ion beam device using same

Charged particle beam device and arithmetic device

Electron microscope and electron beam detector

Electron gun and charged particle beam device having an aperture wi...

Observation specimen for use in electron microscopy, electron micro...

Device for correcting diffraction aberration of electron beam

Charged particle microscope

Scanning ion microscope and secondary particle control method

Gas field ion source and method for using same, ion beam device, an...

Sample electrification measurement method and charged particle beam...

Scanning electron microscope

Ion microscope

Scanning electron microscope having a monochromator

Monochromator and scanning electron microscope using the same

Electron beam apparatus with aberration corrector

Sample electrification measurement method and charged particle beam...

Scanning electron microscope having a monochromator

Electron beam apparatus and method for production of its specimen c...

Scanning electron microscope

Electron beam apparatus and method for production of its specimen c...

Focused ion beam apparatus and focused ion beam irradiation method

Charged particle beam apparatus and charged particle beam irradiati...

Patents Applicationslast 30 patents

ELECTRON BEAM APPLICATION DEVICE

ELECTRON MICROSCOPE

ELECTRON GUN AND ELECTRON BEAM APPLICATION APPARATUS

ELECTRON GUN AND ELECTRON BEAM APPLICATION DEVICE

ELECTRON BEAM APPLICATION DEVICE

ELECTRON GUN AND ELECTRON MICROSCOPE

ELECTRON BEAM APPARATUS

ELECTRON MICROSCOPE

Electron Source and Electron Beam Device Using the Same

Field Emission Electron Source, Method for Manufacturing Same, and...

Charged-Particle-Beam Device

ELECTRON MICROSCOPE AND ELECTRON BEAM DETECTOR

CHARGED PARTICLE MICROSCOPE

CHARGED PARTICLE BEAM DEVICE AND ARITHMETIC DEVICE

SCANNING ION MICROSCOPE AND SECONDARY PARTICLE CONTROL METHOD

ION SOURCE AND ION BEAM DEVICE USING SAME

OBSERVATION SPECIMEN FOR USE IN ELECTRON MICROSCOPY, ELECTRON MICRO...

ELECTRON GUN AND CHARGED PARTICLE BEAM DEVICE

DEVICE FOR CORRECTING DIFFRACTION ABERRATION OF ELECTRON BEAM

Charged Particle Microscope and Ion Microscope

GAS FIELD ION SOURCE AND METHOD FOR USING SAME, ION BEAM DEVICE, AN...

GAS FIELD IONIZATION ION SOURCE, SCANNING CHARGED PARTICLE MICROSCO...

CHARGED PARTICLE MICROSCOPE

ION MICROSCOPE

Sample Electrification Measurement Method and Charged Particle Beam...

SCANNING ELECTRON MICROSCOPE HAVING A MONOCHROMATOR

Gas field ionization ion source, scanning charged particle microsco...

Scanning electron microscope

Electron beam apparatus with aberration corrector

Monochromator and scanning electron microscope using the same