Yoichi Togashi

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Yamagata, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for determining an inspection schedule for a p...
- Patent number 6,021,359
- Issue date Feb 1, 2000
- NEC Corporation
- Takako Sakakibara
- G05 - CONTROLLING REGULATING
Information Patent Grant
Work supplying method and apparatus to batch process apparatus for...
- Patent number 5,930,137
- Issue date Jul 27, 1999
- NEC Corporation
- Yoichi Togashi
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method of producing semiconductor wafer
- Patent number 5,745,364
- Issue date Apr 28, 1998
- NEC Corporation
- Yoichi Togashi
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
Plating apparatus
- Publication number 20070246350
- Publication date Oct 25, 2007
- NEC Electronics Corporation
- Yoichi Togashi
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR