Yoichi Toida

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Kawasaki-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Laser adjustment method and laser source device
- Patent number 10,505,336
- Issue date Dec 10, 2019
- Mitutoyo Corporation
- Tatsuya Narumi
- G02 - OPTICS
Information Patent Grant
Apparatus and method of inspecting gage
- Patent number 6,510,725
- Issue date Jan 28, 2003
- Mitutoyo Corporation
- Yuwu Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Height gauge
- Patent number 6,357,134
- Issue date Mar 19, 2002
- Mitutoyo Corporation
- Nobuyuki Hama
- G01 - MEASURING TESTING
Information Patent Grant
Sensitivity calibrating method for detector of comparator
- Patent number 6,062,062
- Issue date May 16, 2000
- Mitutoyo Corporation
- Yoichi Toida
- G01 - MEASURING TESTING
Information Patent Grant
Surface roughness measuring instrument
- Patent number 5,048,326
- Issue date Sep 17, 1991
- Mitutoyo Corporation
- Yoichi Toida
- G01 - MEASURING TESTING
Information Patent Grant
Levelling device of roughness measuring machine
- Patent number 4,888,984
- Issue date Dec 26, 1989
- Mitutoyo Corporation
- Chihiro Marumo
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LASER ADJUSTMENT METHOD AND LASER SOURCE DEVICE
- Publication number 20170373463
- Publication date Dec 28, 2017
- MITUTOYO CORPORATION
- Tatsuya NARUMI
- G02 - OPTICS
Information Patent Application
Apparatus and method of inspecting gage
- Publication number 20020046005
- Publication date Apr 18, 2002
- Mitutoyo Corporation
- Yuwu Zhang
- G01 - MEASURING TESTING