Yoichiro Iwa

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Ophthalmologic apparatus
- Patent number 7,566,129
- Issue date Jul 28, 2009
- Kabushiki Kaisha Topcon
- Masayuki Hideshima
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Ophthalmologic apparatus
- Patent number 7,533,990
- Issue date May 19, 2009
- Kabushiki Kaisha Topcon
- Masayuki Hideshima
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Ophthalmologic apparatus
- Patent number 7,524,062
- Issue date Apr 28, 2009
- Kabushiki Kaisha Topcon
- Yoichiro Iwa
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Surface inspection method and surface inspection device
- Patent number 7,477,373
- Issue date Jan 13, 2009
- Kabushiki Kaisha Topcon
- Kazuhiro Miyakawa
- G01 - MEASURING TESTING
Information Patent Grant
Particle monitoring apparatus and vacuum processing apparatus
- Patent number 7,417,732
- Issue date Aug 26, 2008
- Kabushiki Kaisha Topcon
- Yoichiro Iwa
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection method and apparatus
- Patent number 7,394,532
- Issue date Jul 1, 2008
- Kabushiki Kaisha Topcon
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection apparatus
- Patent number 7,348,585
- Issue date Mar 25, 2008
- Kabushiki Kaisha Topcon
- Kazuhiro Miyakawa
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection method and surface inspection apparatus
- Patent number 7,245,366
- Issue date Jul 17, 2007
- Kabushiki Kaisha Topcon
- Kazuhiro Miyakawa
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection apparatus
- Patent number 7,227,649
- Issue date Jun 5, 2007
- Kabushiki Kaisha Topcon
- Kazuhiro Miyakawa
- G01 - MEASURING TESTING
Information Patent Grant
Method for inspecting surface and apparatus for inspecting it
- Patent number 7,154,597
- Issue date Dec 26, 2006
- Kabushiki Kaisha Topcon
- Kazuhiro Miyakawa
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspecting apparatus
- Patent number 6,771,364
- Issue date Aug 3, 2004
- Kabushiki Kaisha Topcon
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection apparatus
- Patent number 6,104,481
- Issue date Aug 15, 2000
- Kabushiki Kaisha Topcon
- Akihiko Sekine
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Ophthalmologic apparatus
- Publication number 20080151189
- Publication date Jun 26, 2008
- Yoichiro Iwa
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
OPHTHALMOLOGIC APPARATUS
- Publication number 20080002151
- Publication date Jan 3, 2008
- KABUSHIKI KAISHA TOPCON
- Masayuki Hideshima
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
OPHTHALMOLOGIC APPARATUS
- Publication number 20070296919
- Publication date Dec 27, 2007
- KABUSHIKI KAISHA TOPCON
- Masayuki Hideshima
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Surface inspection method and surface inspection device
- Publication number 20070229813
- Publication date Oct 4, 2007
- Kabushiki Kaisha TOPCON
- Kazuhiro Miyakawa
- G01 - MEASURING TESTING
Information Patent Application
Particle monitoring apparatus and vacuum processing apparatus
- Publication number 20060132769
- Publication date Jun 22, 2006
- Kabushiki Kaisha TOPCON
- Yoichiro Iwa
- G01 - MEASURING TESTING
Information Patent Application
Surface inspection apparatus
- Publication number 20060103856
- Publication date May 18, 2006
- Kabushiki Kaisha TOPCON
- Kazuhiro Miyakawa
- G01 - MEASURING TESTING
Information Patent Application
Surface inspection apparatus
- Publication number 20050270522
- Publication date Dec 8, 2005
- Kabushiki Kaisha TOPCON
- Kazuhiro Miyakawa
- G01 - MEASURING TESTING
Information Patent Application
Method for inspecting surface and apparatus for inspecting it
- Publication number 20040263835
- Publication date Dec 30, 2004
- KABUSHIKI KAISHA TOPCON
- Kazuhiro Miyakawa
- G01 - MEASURING TESTING
Information Patent Application
Surface inspection method and surface inspection apparatus
- Publication number 20040252295
- Publication date Dec 16, 2004
- KABUSHIKI KAISHA TOPCON
- Kazuhiro Miyakawa
- G01 - MEASURING TESTING
Information Patent Application
Surface inspection apparatus
- Publication number 20040169853
- Publication date Sep 2, 2004
- Yoichiro Iwa
- G01 - MEASURING TESTING
Information Patent Application
Surface inspection method and apparatus
- Publication number 20040130727
- Publication date Jul 8, 2004
- Kabushiki Kaisha TOPCON
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Application
Laser light source device and surface inspection apparatus using it
- Publication number 20040095572
- Publication date May 20, 2004
- KABUSHIKI KAISHA TOPCON
- Yoichiro Iwa
- G02 - OPTICS
Information Patent Application
Surface inspecting apparatus
- Publication number 20040036865
- Publication date Feb 26, 2004
- Kabushiki Kaisha TOPCON
- Hisashi Isozaki
- G01 - MEASURING TESTING

Yoichiro Iwa

Person

Patents Grantslast 30 patents

Ophthalmologic apparatus

Ophthalmologic apparatus

Ophthalmologic apparatus

Surface inspection method and surface inspection device

Particle monitoring apparatus and vacuum processing apparatus

Surface inspection method and apparatus

Surface inspection apparatus

Surface inspection method and surface inspection apparatus

Surface inspection apparatus

Method for inspecting surface and apparatus for inspecting it

Surface inspecting apparatus

Surface inspection apparatus

Patents Applicationslast 30 patents

Ophthalmologic apparatus

OPHTHALMOLOGIC APPARATUS

OPHTHALMOLOGIC APPARATUS

Surface inspection method and surface inspection device

Particle monitoring apparatus and vacuum processing apparatus

Surface inspection apparatus

Surface inspection apparatus

Method for inspecting surface and apparatus for inspecting it

Surface inspection method and surface inspection apparatus

Surface inspection apparatus

Surface inspection method and apparatus

Laser light source device and surface inspection apparatus using it

Surface inspecting apparatus