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Yoichiro Mae
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Osaka, JP
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last 30 patents
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Patent Grant
Semiconductor integrated circuit, and semiconductor system includin...
Patent number
7,343,547
Issue date
Mar 11, 2008
Matsushita Electric Industrial Co., Ltd.
Kimihiko Aiba
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Verification Apparatus and Verification Method
Publication number
20080221861
Publication date
Sep 11, 2008
Kei Yoneda
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
Semiconductor integrated circuit, and semiconductor system includin...
Publication number
20060282721
Publication date
Dec 14, 2006
Kimihiko Aiba
G01 - MEASURING TESTING