Yoichiro Neo

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Kokubunji, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of inspecting pattern and inspecting instrument
- Patent number 7,876,113
- Issue date Jan 25, 2011
- Hitachi, Ltd.
- Mari Nozoe
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting pattern and inspecting instrument
- Patent number 6,924,482
- Issue date Aug 2, 2005
- Hitachi, Ltd.
- Mari Nozoe
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method of semiconductor device and inspection system
- Patent number 6,859,060
- Issue date Feb 22, 2005
- Hitachi, Ltd.
- Yoichiro Neo
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting pattern and inspecting instrument
- Patent number 6,586,952
- Issue date Jul 1, 2003
- Mari Nozoe
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method of inspecting pattern and inspecting instrument
- Publication number 20030179007
- Publication date Sep 25, 2003
- Hitachi, Ltd.
- Mari Nozoe
- G01 - MEASURING TESTING
Information Patent Application
Inspection method of semiconductor device and inspection system
- Publication number 20030071646
- Publication date Apr 17, 2003
- Yoichiro Neo
- G01 - MEASURING TESTING
Information Patent Application
Method of inspecting pattern and inspecting instrument
- Publication number 20010052781
- Publication date Dec 20, 2001
- Mari Nozoe
- G01 - MEASURING TESTING