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Yoichiro SUZUKI
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Mito, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Apparatus, method for determining state of sample, and analysis system
Patent number
11,282,184
Issue date
Mar 22, 2022
Hitachi High-Technologies Corporation
Yasuki Kakishita
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Automated analyzer
Patent number
10,884,009
Issue date
Jan 5, 2021
HITACHI HIGH-TECH CORPORATION
Hidetsugu Tanoue
G01 - MEASURING TESTING
Information
Patent Grant
Liquid surface inspection device, automated analysis device, and pr...
Patent number
10,739,364
Issue date
Aug 11, 2020
HITACHI HIGH-TECH CORPORATION
Yoshimichi Satou
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analytical apparatus
Patent number
10,274,506
Issue date
Apr 30, 2019
Hitachi High-Technologies Corporation
Kazuhiro Noda
G01 - MEASURING TESTING
Information
Patent Grant
Chemical analysis apparatus and chemical analysis method
Patent number
9,291,634
Issue date
Mar 22, 2016
Hitachi High-Technologies Corporation
Hajime Katou
G01 - MEASURING TESTING
Information
Patent Grant
Chemical analysis apparatus and chemical analysis method
Patent number
8,658,102
Issue date
Feb 25, 2014
Hitachi High-Technologies Corporation
Hajime Katou
G01 - MEASURING TESTING
Information
Patent Grant
Luminescence measuring apparatus
Patent number
7,903,248
Issue date
Mar 8, 2011
Hitachi High-Technologies Corporation
Hidetsugu Tanoue
G01 - MEASURING TESTING
Information
Patent Grant
Chemical analysis apparatus and chemical analysis method
Patent number
7,722,815
Issue date
May 25, 2010
Hitachi High-Technologies Corporation
Hajime Katou
G01 - MEASURING TESTING
Information
Patent Grant
Chemical analysis apparatus and chemical analysis method
Patent number
7,670,558
Issue date
Mar 2, 2010
Hitachi High-Technologies Corporation
Hajime Katou
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analysis apparatus
Patent number
6,773,672
Issue date
Aug 10, 2004
Hitachi, Ltd.
Masaaki Odakura
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
AUTOMATIC ANALYZER AND TILT ADJUSTMENT METHOD THEREOF
Publication number
20240175885
Publication date
May 30, 2024
HITACHI HIGH-TECH CORPORATION
Kenshiro SAKATA
G01 - MEASURING TESTING
Information
Patent Application
Pressure Sensor Module and Dispensing Device
Publication number
20240133757
Publication date
Apr 25, 2024
Hitachi High-Tech Corporation
Masatoshi KANAMARU
G01 - MEASURING TESTING
Information
Patent Application
IMAGE PROCESSING DEVICE AND METHOD, AND IMAGE PROCESSING SYSTEM
Publication number
20240119698
Publication date
Apr 11, 2024
HITACHI HIGH-TECH CORPORATION
Yasuki KAKISHITA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Automatic Analyzer
Publication number
20230349941
Publication date
Nov 2, 2023
Hitachi High-Tech Corporation
Noritaka MINAMI
G01 - MEASURING TESTING
Information
Patent Application
Automatic Analyzer
Publication number
20230251279
Publication date
Aug 10, 2023
Hitachi High-Tech Corporation
Takahiro KUMAGAI
G01 - MEASURING TESTING
Information
Patent Application
Automatic Chemical Analysis Apparatus and Electrical Impedance Spec...
Publication number
20230228783
Publication date
Jul 20, 2023
Hitachi High-Tech Corporation
Hajime KATO
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20230114608
Publication date
Apr 13, 2023
HITACHI HIGH-TECH CORPORATION
Erika INAGAKI
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20230078595
Publication date
Mar 16, 2023
HITACHI HIGH-TECH CORPORATION
Kumiko KANAI
G01 - MEASURING TESTING
Information
Patent Application
COMPUTING MACHINE, LEARNING METHOD OF CLASSIFIER, AND ANALYSIS SYSTEM
Publication number
20230072040
Publication date
Mar 9, 2023
HITACHI HIGH-TECH CORPORATION
Yasuki KAKISHITA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IMAGE PROCESSING APPARATUS, AUTOMATIC ANALYSIS SYSTEM, AND IMAGE PR...
Publication number
20220172341
Publication date
Jun 2, 2022
HITACHI HIGH-TECH CORPORATION
Yasuki KAKISHITA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20200271679
Publication date
Aug 27, 2020
Hitachi High-Technologies Corporation
Hiroki NAKANO
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS, METHOD FOR DETERMINING STATE OF SAMPLE, AND ANALYSIS SYSTEM
Publication number
20200242752
Publication date
Jul 30, 2020
Hitachi High-Technologies Corporation
Yasuki KAKISHITA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Automated Analyzer
Publication number
20190107549
Publication date
Apr 11, 2019
Hitachi High-Technologies Corporation
Hidetsugu TANOUE
G01 - MEASURING TESTING
Information
Patent Application
LIQUID SURFACE INSPECTION DEVICE, AUTOMATED ANALYSIS DEVICE, AND PR...
Publication number
20180003728
Publication date
Jan 4, 2018
Hitachi High-Technologies Corporation
Yoshimichi SATOU
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYTICAL APPARATUS
Publication number
20160334431
Publication date
Nov 17, 2016
Hitachi High-Technologies Corporation
Kazuhiro NODA
G01 - MEASURING TESTING
Information
Patent Application
CHEMICAL ANALYSIS APPARATUS AND CHEMICAL ANALYSIS METHOD
Publication number
20140147348
Publication date
May 29, 2014
Hitachi High-Technologies Corporation
Hajime KATOU
G01 - MEASURING TESTING
Information
Patent Application
CHEMICAL ANALYSIS APPARATUS AND CHEMICAL ANALYSIS METHOD
Publication number
20100233027
Publication date
Sep 16, 2010
Hajime Katou
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
AUTOMATED ANALYZER
Publication number
20090022626
Publication date
Jan 22, 2009
Hidetsugu TANOUE
G01 - MEASURING TESTING
Information
Patent Application
LUMINESCENCE MEASURING APPARATUS
Publication number
20080225279
Publication date
Sep 18, 2008
Hidetsugu TANOUE
G01 - MEASURING TESTING
Information
Patent Application
Chemical analysis apparatus and chemical analysis method
Publication number
20070009387
Publication date
Jan 11, 2007
Hajime Katou
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Chemical analysis apparatus and chemical analysis method
Publication number
20030166260
Publication date
Sep 4, 2003
Hajime Katou
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Automatic analysis apparatus
Publication number
20020025579
Publication date
Feb 28, 2002
Masaaki Odakura
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL