Yoichiro SUZUKI

Person

Mito, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Automatic analyzer
- Patent number 12,188,953
- Issue date Jan 7, 2025
- HITACHI HIGH-TECH CORPORATION
- Hiroki Nakano
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, method for determining state of sample, and analysis system
- Patent number 11,282,184
- Issue date Mar 22, 2022
- Hitachi High-Technologies Corporation
- Yasuki Kakishita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated analyzer
- Patent number 10,884,009
- Issue date Jan 5, 2021
- HITACHI HIGH-TECH CORPORATION
- Hidetsugu Tanoue
- G01 - MEASURING TESTING
Information Patent Grant
Liquid surface inspection device, automated analysis device, and pr...
- Patent number 10,739,364
- Issue date Aug 11, 2020
- HITACHI HIGH-TECH CORPORATION
- Yoshimichi Satou
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analytical apparatus
- Patent number 10,274,506
- Issue date Apr 30, 2019
- Hitachi High-Technologies Corporation
- Kazuhiro Noda
- G01 - MEASURING TESTING
Information Patent Grant
Chemical analysis apparatus and chemical analysis method
- Patent number 9,291,634
- Issue date Mar 22, 2016
- Hitachi High-Technologies Corporation
- Hajime Katou
- G01 - MEASURING TESTING
Information Patent Grant
Chemical analysis apparatus and chemical analysis method
- Patent number 8,658,102
- Issue date Feb 25, 2014
- Hitachi High-Technologies Corporation
- Hajime Katou
- G01 - MEASURING TESTING
Information Patent Grant
Luminescence measuring apparatus
- Patent number 7,903,248
- Issue date Mar 8, 2011
- Hitachi High-Technologies Corporation
- Hidetsugu Tanoue
- G01 - MEASURING TESTING
Information Patent Grant
Chemical analysis apparatus and chemical analysis method
- Patent number 7,722,815
- Issue date May 25, 2010
- Hitachi High-Technologies Corporation
- Hajime Katou
- G01 - MEASURING TESTING
Information Patent Grant
Chemical analysis apparatus and chemical analysis method
- Patent number 7,670,558
- Issue date Mar 2, 2010
- Hitachi High-Technologies Corporation
- Hajime Katou
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis apparatus
- Patent number 6,773,672
- Issue date Aug 10, 2004
- Hitachi, Ltd.
- Masaaki Odakura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20250044311
- Publication date Feb 6, 2025
- Hitachi High-Tech Corporation
- Kenshiro SAKATA
- G01 - MEASURING TESTING
Information Patent Application
CAMERA HOLDING DEVICE FOR AUTOMATIC ANALYSIS APPARATUS
- Publication number 20250012826
- Publication date Jan 9, 2025
- Hitachi High-Tech Corporation
- Manabu OCHI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
PRESSURE SENSOR MODULE AND DISPENSING DEVICE INCLUDING PRESSURE SEN...
- Publication number 20240408560
- Publication date Dec 12, 2024
- HITACHI HIGH-TECH CORPORATION
- Masatoshi KANAMARU
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE
- Publication number 20240377424
- Publication date Nov 14, 2024
- HITACHI HIGH-TECH CORPORATION
- Yosuke HORIE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pressure Sensor
- Publication number 20240353278
- Publication date Oct 24, 2024
- Hitachi High-Tech Corporation
- Tatsuya YAMASAKI
- G01 - MEASURING TESTING
Information Patent Application
IMAGING DEVICE
- Publication number 20240284027
- Publication date Aug 22, 2024
- Hitachi High-Tech Corporation
- Manabu OCHI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
AUTOMATIC CHEMICAL ANALYZER, AUTOMATIC CHEMICAL ANALYZER MAINTENANC...
- Publication number 20240230693
- Publication date Jul 11, 2024
- HITACHI HIGH-TECH CORPORATION
- Hajime KATO
- G01 - MEASURING TESTING
Information Patent Application
Pressure Sensor Module and Dispensing Device
- Publication number 20240230441
- Publication date Jul 11, 2024
- Hitachi High-Tech Corporation
- Masatoshi KANAMARU
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER AND TILT ADJUSTMENT METHOD THEREOF
- Publication number 20240175885
- Publication date May 30, 2024
- HITACHI HIGH-TECH CORPORATION
- Kenshiro SAKATA
- G01 - MEASURING TESTING
Information Patent Application
Pressure Sensor Module and Dispensing Device
- Publication number 20240133757
- Publication date Apr 25, 2024
- Hitachi High-Tech Corporation
- Masatoshi KANAMARU
- G01 - MEASURING TESTING
Information Patent Application
IMAGE PROCESSING DEVICE AND METHOD, AND IMAGE PROCESSING SYSTEM
- Publication number 20240119698
- Publication date Apr 11, 2024
- HITACHI HIGH-TECH CORPORATION
- Yasuki KAKISHITA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Automatic Analyzer
- Publication number 20230349941
- Publication date Nov 2, 2023
- Hitachi High-Tech Corporation
- Noritaka MINAMI
- G01 - MEASURING TESTING
Information Patent Application
Automatic Analyzer
- Publication number 20230251279
- Publication date Aug 10, 2023
- Hitachi High-Tech Corporation
- Takahiro KUMAGAI
- G01 - MEASURING TESTING
Information Patent Application
Automatic Chemical Analysis Apparatus and Electrical Impedance Spec...
- Publication number 20230228783
- Publication date Jul 20, 2023
- Hitachi High-Tech Corporation
- Hajime KATO
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20230114608
- Publication date Apr 13, 2023
- HITACHI HIGH-TECH CORPORATION
- Erika INAGAKI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20230078595
- Publication date Mar 16, 2023
- HITACHI HIGH-TECH CORPORATION
- Kumiko KANAI
- G01 - MEASURING TESTING
Information Patent Application
COMPUTING MACHINE, LEARNING METHOD OF CLASSIFIER, AND ANALYSIS SYSTEM
- Publication number 20230072040
- Publication date Mar 9, 2023
- HITACHI HIGH-TECH CORPORATION
- Yasuki KAKISHITA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE PROCESSING APPARATUS, AUTOMATIC ANALYSIS SYSTEM, AND IMAGE PR...
- Publication number 20220172341
- Publication date Jun 2, 2022
- HITACHI HIGH-TECH CORPORATION
- Yasuki KAKISHITA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20200271679
- Publication date Aug 27, 2020
- Hitachi High-Technologies Corporation
- Hiroki NAKANO
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS, METHOD FOR DETERMINING STATE OF SAMPLE, AND ANALYSIS SYSTEM
- Publication number 20200242752
- Publication date Jul 30, 2020
- Hitachi High-Technologies Corporation
- Yasuki KAKISHITA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Automated Analyzer
- Publication number 20190107549
- Publication date Apr 11, 2019
- Hitachi High-Technologies Corporation
- Hidetsugu TANOUE
- G01 - MEASURING TESTING
Information Patent Application
LIQUID SURFACE INSPECTION DEVICE, AUTOMATED ANALYSIS DEVICE, AND PR...
- Publication number 20180003728
- Publication date Jan 4, 2018
- Hitachi High-Technologies Corporation
- Yoshimichi SATOU
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYTICAL APPARATUS
- Publication number 20160334431
- Publication date Nov 17, 2016
- Hitachi High-Technologies Corporation
- Kazuhiro NODA
- G01 - MEASURING TESTING
Information Patent Application
CHEMICAL ANALYSIS APPARATUS AND CHEMICAL ANALYSIS METHOD
- Publication number 20140147348
- Publication date May 29, 2014
- Hitachi High-Technologies Corporation
- Hajime KATOU
- G01 - MEASURING TESTING
Information Patent Application
CHEMICAL ANALYSIS APPARATUS AND CHEMICAL ANALYSIS METHOD
- Publication number 20100233027
- Publication date Sep 16, 2010
- Hajime Katou
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
AUTOMATED ANALYZER
- Publication number 20090022626
- Publication date Jan 22, 2009
- Hidetsugu TANOUE
- G01 - MEASURING TESTING
Information Patent Application
LUMINESCENCE MEASURING APPARATUS
- Publication number 20080225279
- Publication date Sep 18, 2008
- Hidetsugu TANOUE
- G01 - MEASURING TESTING
Information Patent Application
Chemical analysis apparatus and chemical analysis method
- Publication number 20070009387
- Publication date Jan 11, 2007
- Hajime Katou
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Chemical analysis apparatus and chemical analysis method
- Publication number 20030166260
- Publication date Sep 4, 2003
- Hajime Katou
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Automatic analysis apparatus
- Publication number 20020025579
- Publication date Feb 28, 2002
- Masaaki Odakura
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL

Yoichiro SUZUKI

Person

Patents Grantslast 30 patents

Automatic analyzer

Apparatus, method for determining state of sample, and analysis system

Automated analyzer

Liquid surface inspection device, automated analysis device, and pr...

Automatic analytical apparatus

Chemical analysis apparatus and chemical analysis method

Chemical analysis apparatus and chemical analysis method

Luminescence measuring apparatus

Chemical analysis apparatus and chemical analysis method

Chemical analysis apparatus and chemical analysis method

Automatic analysis apparatus

Patents Applicationslast 30 patents

AUTOMATIC ANALYZER

CAMERA HOLDING DEVICE FOR AUTOMATIC ANALYSIS APPARATUS

PRESSURE SENSOR MODULE AND DISPENSING DEVICE INCLUDING PRESSURE SEN...

AUTOMATIC ANALYSIS DEVICE

Pressure Sensor

IMAGING DEVICE

AUTOMATIC CHEMICAL ANALYZER, AUTOMATIC CHEMICAL ANALYZER MAINTENANC...

Pressure Sensor Module and Dispensing Device

AUTOMATIC ANALYZER AND TILT ADJUSTMENT METHOD THEREOF

Pressure Sensor Module and Dispensing Device

IMAGE PROCESSING DEVICE AND METHOD, AND IMAGE PROCESSING SYSTEM

Automatic Analyzer

Automatic Analyzer

Automatic Chemical Analysis Apparatus and Electrical Impedance Spec...

AUTOMATIC ANALYZER

AUTOMATIC ANALYZER

COMPUTING MACHINE, LEARNING METHOD OF CLASSIFIER, AND ANALYSIS SYSTEM

IMAGE PROCESSING APPARATUS, AUTOMATIC ANALYSIS SYSTEM, AND IMAGE PR...

AUTOMATIC ANALYZER

APPARATUS, METHOD FOR DETERMINING STATE OF SAMPLE, AND ANALYSIS SYSTEM

Automated Analyzer

LIQUID SURFACE INSPECTION DEVICE, AUTOMATED ANALYSIS DEVICE, AND PR...

AUTOMATIC ANALYTICAL APPARATUS

CHEMICAL ANALYSIS APPARATUS AND CHEMICAL ANALYSIS METHOD

CHEMICAL ANALYSIS APPARATUS AND CHEMICAL ANALYSIS METHOD

AUTOMATED ANALYZER

LUMINESCENCE MEASURING APPARATUS

Chemical analysis apparatus and chemical analysis method

Chemical analysis apparatus and chemical analysis method

Automatic analysis apparatus