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Yoichiro Ueda
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Osaka-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Mounted component inspection apparatus, component mounting machine...
Patent number
8,406,503
Issue date
Mar 26, 2013
Panasonic Corporation
Yoichiro Ueda
G01 - MEASURING TESTING
Information
Patent Grant
Ultrasonic measuring method, electronic component manufacturing met...
Patent number
8,138,601
Issue date
Mar 20, 2012
Panasonic Corporation
Shinsuke Komatsu
G01 - MEASURING TESTING
Information
Patent Grant
Ultrasonic wave measuring method and apparatus
Patent number
8,091,426
Issue date
Jan 10, 2012
Panasonic Corporation
Shinsuke Komatsu
G01 - MEASURING TESTING
Information
Patent Grant
Ultrasonic flaw detection method and ultrasonic flaw detection device
Patent number
7,793,546
Issue date
Sep 14, 2010
Panasonic Corporation
Hiroaki Katsura
G01 - MEASURING TESTING
Information
Patent Grant
Reference position determining method
Patent number
7,657,997
Issue date
Feb 9, 2010
Panasonic Corporation
Kentaro Nishiwaki
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method and apparatus of electromagnetic measurement
Patent number
7,541,818
Issue date
Jun 2, 2009
Panasonic Corporation
Hirofumi Kosaka
G01 - MEASURING TESTING
Information
Patent Grant
Bump inspection apparatus and method for IC component, bump forming...
Patent number
7,539,338
Issue date
May 26, 2009
Panasonic Corporation
Takayuki Fukae
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Component mounting control method
Patent number
7,051,431
Issue date
May 30, 2006
Matsushita Electric Industrial Co., Ltd.
Yoichiro Ueda
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Three-dimensional measuring apparatus and three-dimensional measuri...
Patent number
5,841,539
Issue date
Nov 24, 1998
Matsushita Electric Industrial Co., Ltd.
Kazuhiro Ikurumi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ULTRASONIC WAVE MEASURING METHOD AND APPARATUS
Publication number
20100224000
Publication date
Sep 9, 2010
Shinsuke Komatsu
G01 - MEASURING TESTING
Information
Patent Application
MOUNTED COMPONENT INSPECTION APPARATUS, COMPONENT MOUNTING MACHINE...
Publication number
20100189340
Publication date
Jul 29, 2010
PANASONIC CORPORATION
Yoichiro Ueda
G01 - MEASURING TESTING
Information
Patent Application
Ultrasonic Flaw Detection Method and Ultrasonic Flaw Detection Device
Publication number
20090301201
Publication date
Dec 10, 2009
Matsushita Electric Indusdtrial Co., Ltd.
Hiroaki Katsura
G01 - MEASURING TESTING
Information
Patent Application
ULTRASONIC MEASURING METHOD, ELECTRONIC COMPONENT MANUFACTURING MET...
Publication number
20090189278
Publication date
Jul 30, 2009
Shinsuke KOMATSU
G01 - MEASURING TESTING
Information
Patent Application
Ultrasonic Inspection Method and Ultrasonic Inspection Device
Publication number
20080053230
Publication date
Mar 6, 2008
Hiroaki Katsura
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus of electromagnetic measurement
Publication number
20070024293
Publication date
Feb 1, 2007
Matsushita Electric Industrial., Ltd.
Hirofumi Kosaka
G01 - MEASURING TESTING
Information
Patent Application
Reference position determining method and apparatus for electronic...
Publication number
20060048383
Publication date
Mar 9, 2006
Kentaro Nishiwaki
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Bump inspection apparatus and method for IC component, bump forming...
Publication number
20060040442
Publication date
Feb 23, 2006
Takayuki Fukae
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Component mounting control method
Publication number
20040049758
Publication date
Mar 11, 2004
Matsushita Elec. Ind. Co. Ltd.
Yoichiro Ueda
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR