Yoji Mashiko

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Scanning probe microscope
- Patent number 6,545,470
- Issue date Apr 8, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Yukari Imai
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting and analyzing impurities
- Patent number 5,162,233
- Issue date Nov 10, 1992
- Mitsubishi Denki Kabushiki Kaisha
- Junko Komori
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing a read only memory device using a focused...
- Patent number 5,130,273
- Issue date Jul 14, 1992
- Mitsubishi Denki Kabushiki Kaisha
- Yoji Mashiko
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of fibricating a semiconductor device having a trench
- Patent number 5,112,771
- Issue date May 12, 1992
- Mitsubishi Denki Kabushiki Kaisha
- Tatsuya Ishii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for forming electrodes for semiconductor devices by focused...
- Patent number 5,043,290
- Issue date Aug 27, 1991
- Mitsubishi Denki Kabushiki Kaisha
- Tadashi Nishioka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Read only memory device including a superconductive electrode
- Patent number 4,990,489
- Issue date Feb 5, 1991
- Mitsubishi Denki Kabushiki Kaisha
- Yoji Mashiko
- G11 - INFORMATION STORAGE
Information Patent Grant
Process for forming electrodes for semiconductor devices using focu...
- Patent number 4,962,059
- Issue date Oct 9, 1990
- Mitsubishi Denki Kabushiki Kaisha
- Tadashi Nishioka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for forming electrodes for semiconductor devices
- Patent number 4,948,749
- Issue date Aug 14, 1990
- Mitsubishi Denki Kabushiki Kaisha
- Tadashi Nishioka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for forming electrodes for semiconductor devices using focu...
- Patent number 4,853,341
- Issue date Aug 1, 1989
- Mitsubishi Denki Kabushiki Kaisha
- Tadashi Nishioka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for identifying a blistered film in layered films
- Patent number 4,843,238
- Issue date Jun 27, 1989
- Mitsubishi Denki Kabushiki Kaisha
- Tadashi Nishioka
- G01 - MEASURING TESTING
Information Patent Grant
Aluminum circuit to be disconnected and method of cutting the same
- Patent number 4,723,062
- Issue date Feb 2, 1988
- Mitsubishi Denki Kabushiki Kaisha
- Tadashi Nishioka
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Aluminum circuit to be disconnected and method of cutting the same
- Patent number 4,691,078
- Issue date Sep 1, 1987
- Mitsubishi Denki Kabushiki Kaisha
- Tadashi Nishioka
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method of treating silicon nitride film formed by plasma deposition
- Patent number 4,636,400
- Issue date Jan 13, 1987
- Mitsubishi Denki Kabushiki Kaisha
- Tadashi Nishioka
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Process for fabricating a semiconductor device
- Patent number 4,414,242
- Issue date Nov 8, 1983
- Mitsubishi Denki Kabushiki Kaisha
- Tadashi Nishimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming patterns by plasma etching
- Patent number 4,377,734
- Issue date Mar 22, 1983
- Mitsubishi Denki Kabushiki Kaisha
- Yoji Mashiko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming a fine pattern of an aluminum film
- Patent number 4,314,874
- Issue date Feb 9, 1982
- Mitsubishi Denki Kabushiki Kaisha
- Haruhiko Abe
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
Processing method of semiconductor substrate
- Publication number 20040203257
- Publication date Oct 14, 2004
- Renesas Technology Corp.
- Takeshi Yoshida
- G02 - OPTICS
Information Patent Application
Electronic device having multilayer interconnection structure
- Publication number 20030047810
- Publication date Mar 13, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Hitoshi Maeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning probe microscope
- Publication number 20030025498
- Publication date Feb 6, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Yukari Imai
- B82 - NANO-TECHNOLOGY

Yoji Mashiko

Person

Patents Grantslast 30 patents

Scanning probe microscope

Method of detecting and analyzing impurities

Method for manufacturing a read only memory device using a focused...

Method of fibricating a semiconductor device having a trench

Process for forming electrodes for semiconductor devices by focused...

Read only memory device including a superconductive electrode

Process for forming electrodes for semiconductor devices using focu...

Process for forming electrodes for semiconductor devices

Process for forming electrodes for semiconductor devices using focu...

Method for identifying a blistered film in layered films

Aluminum circuit to be disconnected and method of cutting the same

Aluminum circuit to be disconnected and method of cutting the same

Method of treating silicon nitride film formed by plasma deposition

Process for fabricating a semiconductor device

Method for forming patterns by plasma etching

Method for forming a fine pattern of an aluminum film

Patents Applicationslast 30 patents

Processing method of semiconductor substrate

Electronic device having multilayer interconnection structure

Scanning probe microscope