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Yoji Nakata
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor device having a potential fuse, and method of manufac...
Patent number
6,787,878
Issue date
Sep 7, 2004
Renesas Technology Corp.
Yukihiro Nagai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device and method of fabricating the same
Patent number
6,770,557
Issue date
Aug 3, 2004
Renesas Technology Corp.
Yoji Nakata
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device having test mark
Patent number
6,744,143
Issue date
Jun 1, 2004
Renesas Technology Corp.
Jiro Matsufusa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of manufacturing semiconductor device
Patent number
6,635,563
Issue date
Oct 21, 2003
Mitsubishi Denki Kabushiki Kaisha
Yoji Nakata
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of manufacturing contact structure
Patent number
6,337,268
Issue date
Jan 8, 2002
Mitsubishi Denki Kabushiki Kaisha
Shigenori Kido
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of manufacturing semiconductor device
Patent number
6,313,005
Issue date
Nov 6, 2001
Mitsubishi Denki Kabushiki Kaisha
Takeshi Kishida
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Semiconductor device and method of fabricating the same
Publication number
20030008498
Publication date
Jan 9, 2003
Mitsubishi Denki Kabushiki Kaisha
Yoji Nakata
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of manufacturing semicondutor device
Publication number
20020098674
Publication date
Jul 25, 2002
Mitsubishi Denki Kabushiki Kaisha
Yoji Nakata
H01 - BASIC ELECTRIC ELEMENTS