Yoji OGINO

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Saitama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Electronic device test apparatus
- Patent number 8,749,255
- Issue date Jun 10, 2014
- Advantest Corporation
- Yasuhide Takeda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRONIC DEVICE TEST APPARATUS
- Publication number 20110248734
- Publication date Oct 13, 2011
- Advantest Corporation
- Yasuhide TAKEDA
- G01 - MEASURING TESTING