Yoko Irie

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Kawasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method and device of inspecting three-dimensional shape defect
- Patent number 6,072,899
- Issue date Jun 6, 2000
- Hitachi, Ltd.
- Yoko Irie
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wiring pattern inspecting method and system for carrying out the same
- Patent number 5,930,382
- Issue date Jul 27, 1999
- Hitachi, Ltd.
- Yoko Irie
- G06 - COMPUTING CALCULATING COUNTING