Yoko Miyazaki

Person

Hachioji, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Appearance inspection apparatus and projection method for projectin...
- Patent number 7,330,265
- Issue date Feb 12, 2008
- Tokyo Seimitsu Co., Ltd.
- Toshiro Kurosawa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection analyzing apparatus and semiconductor device
- Patent number 6,551,847
- Issue date Apr 22, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Kyoko Asahina
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor inspection system, and method of manufacturing a semi...
- Patent number 6,528,334
- Issue date Mar 4, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Mariko Mizuo
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus
- Patent number 6,437,862
- Issue date Aug 20, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Yoko Miyazaki
- G01 - MEASURING TESTING
Information Patent Grant
Alignment method and semiconductor device
- Patent number 6,400,038
- Issue date Jun 4, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Toshiaki Mugibayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection apparatus for foreign matter and pattern defect
- Patent number 6,344,897
- Issue date Feb 5, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Yoko Miyazaki
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus for foreign matter and pattern defect
- Patent number 6,295,126
- Issue date Sep 25, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Yoko Miyazaki
- G01 - MEASURING TESTING
Information Patent Grant
Alignment method and semiconductor device
- Patent number 6,242,318
- Issue date Jun 5, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Toshiaki Mugibayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for inspecting pattern defect
- Patent number 6,031,607
- Issue date Feb 29, 2000
- Mitsubishi Denki Kabushiki Kaisha
- Yoko Miyazaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection data analyzing apparatus for in-line inspection with enh...
- Patent number 6,016,562
- Issue date Jan 18, 2000
- Mitsubishi Denki Kabushiki Kaisha
- Yoko Miyazaki
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing a spatial frequency filter for use in a pat...
- Patent number 5,379,150
- Issue date Jan 3, 1995
- Mitsubishi Denki Kabushiki Kaisha
- Yoko Miyazaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern defect detection device and a spatial frequency filter used...
- Patent number 5,289,260
- Issue date Feb 22, 1994
- Mitsubishi Denki Kabushiki Kaisha
- Yoko Miyazaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection device for detecting defects in a periodic pattern on a...
- Patent number 5,170,063
- Issue date Dec 8, 1992
- Mitsubishi Denki Kabushiki Kaisha
- Yoko Miyazaki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor Surface Inspection Apparatus and Method of Illumination
- Publication number 20080024794
- Publication date Jan 31, 2008
- Yoko Miyazaki
- G01 - MEASURING TESTING
Information Patent Application
Appearance inspection apparatus and projection method for projectin...
- Publication number 20060007436
- Publication date Jan 12, 2006
- Toshiro Kurosawa
- G01 - MEASURING TESTING
Information Patent Application
Inspection analyzing apparatus and semiconductor device
- Publication number 20020081756
- Publication date Jun 27, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Kyoko Asahina
- G01 - MEASURING TESTING
Information Patent Application
Inspection apparatus for foreign matter and pattern defect
- Publication number 20010046044
- Publication date Nov 29, 2001
- Mitsubishi Denki Kabushki Kaisha
- Yoko Miyazaki
- G01 - MEASURING TESTING
Information Patent Application
Alignment method and semiconductor device
- Publication number 20010010940
- Publication date Aug 2, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Toshiaki Mugibayashi
- H01 - BASIC ELECTRIC ELEMENTS

Yoko Miyazaki

Person

Patents Grantslast 30 patents

Appearance inspection apparatus and projection method for projectin...

Inspection analyzing apparatus and semiconductor device

Semiconductor inspection system, and method of manufacturing a semi...

Defect inspection apparatus

Alignment method and semiconductor device

Inspection apparatus for foreign matter and pattern defect

Inspection apparatus for foreign matter and pattern defect

Alignment method and semiconductor device

System and method for inspecting pattern defect

Inspection data analyzing apparatus for in-line inspection with enh...

Method of manufacturing a spatial frequency filter for use in a pat...

Pattern defect detection device and a spatial frequency filter used...

Inspection device for detecting defects in a periodic pattern on a...

Patents Applicationslast 30 patents

Semiconductor Surface Inspection Apparatus and Method of Illumination

Appearance inspection apparatus and projection method for projectin...

Inspection analyzing apparatus and semiconductor device

Inspection apparatus for foreign matter and pattern defect

Alignment method and semiconductor device