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Yoko Nakai

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  • Kyoto-shi, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Sample analyzing device
    • Patent number 12,123,887
    • Issue date Oct 22, 2024
    • HORIBA ADVANCED TECHNO, CO., LTD.
    • Hideki Nakayama
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Biological sample analysis device
    • Patent number 11,280,741
    • Issue date Mar 22, 2022
    • HORIBA ADVANCED TECHNO, CO., LTD.
    • Kazuya Nakagawa
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Reference electrode
    • Patent number 10,914,707
    • Issue date Feb 9, 2021
    • Horiba, Ltd.
    • Kazuhiro Miyamura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Measuring instrument
    • Patent number 10,684,252
    • Issue date Jun 16, 2020
    • HORIBA, LTD.
    • Kazuhiro Miyamura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Reference electrode
    • Patent number 10,241,068
    • Issue date Mar 26, 2019
    • HORIBA, LTD.
    • Kazuhiro Miyamura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Absorption spectrometer and calibration curve preparation method th...
    • Patent number 9,797,831
    • Issue date Oct 24, 2017
    • HORIBA, LTD.
    • Yuichiro Morimoto
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Spectroscopic analysis method and spectroscopic analyzer
    • Patent number 9,557,261
    • Issue date Jan 31, 2017
    • HORIBA, Ltd.
    • Takaaki Yada
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Analyzer
    • Patent number 8,305,574
    • Issue date Nov 6, 2012
    • Horiba, Ltd.
    • Kimihiko Arimoto
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents