Yoko Sato

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Kawasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Voltage and displacement measuring apparatus and probe
- Patent number 5,999,005
- Issue date Dec 7, 1999
- Fujitsu Limited
- Akira Fujii
- G01 - MEASURING TESTING
Information Patent Grant
Voltage and displacement measuring apparatus and probe
- Patent number 5,677,635
- Issue date Oct 14, 1997
- Fujitsu Limited
- Akira Fujii
- G01 - MEASURING TESTING
Information Patent Grant
Probing device and system for testing an integrated circuit
- Patent number 5,331,275
- Issue date Jul 19, 1994
- Fujitsu Limited
- Kazuyuki Ozaki
- B82 - NANO-TECHNOLOGY