Membership
Tour
Register
Log in
Yonatan Lehman
Follow
Person
Bet Gamliel, IL
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Raster frame beam system for electron beam lithography
Patent number
7,842,935
Issue date
Nov 30, 2010
Applied Materials Israel, Ltd.
Meir Aloni
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Raster frame beam system for electron beam lithography
Patent number
7,521,700
Issue date
Apr 21, 2009
Applied Materials, Israel, Ltd.
Meir Aloni
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Reticle design inspection system
Patent number
7,079,235
Issue date
Jul 18, 2006
Applied Materials, Inc.
Yonatan Lehman
G01 - MEASURING TESTING
Information
Patent Grant
Reticle design inspection system
Patent number
6,466,314
Issue date
Oct 15, 2002
Applied Materials, Inc.
Yonatan Lehman
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Data converter apparatus and method particularly useful for a datab...
Patent number
6,366,687
Issue date
Apr 2, 2002
Applied Materials, Inc.
Meir Aloni
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
Raster Frame Beam System For Electron Beam Lithography
Publication number
20060243918
Publication date
Nov 2, 2006
Meir Aloni
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Raster Frame Beam System For Electron Beam Lithography
Publication number
20060243922
Publication date
Nov 2, 2006
Meir Aloni
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Reticle design inspection system
Publication number
20030086081
Publication date
May 8, 2003
APPLIED MATERIALS, INC.
Yonatan Lehman
G01 - MEASURING TESTING
Information
Patent Application
Method of and apparatus for inspection of articles by comparison wi...
Publication number
20030048939
Publication date
Mar 13, 2003
APPLIED MATERIALS, INC.
Yonatan Lehman
G01 - MEASURING TESTING