YONATAN OREN

Person

KIRYAT ONO, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Accurate Raman spectroscopy
- Patent number 12,163,892
- Issue date Dec 10, 2024
- Nova Ltd.
- Elad Schleifer
- G01 - MEASURING TESTING
Information Patent Grant
Accurate Raman spectroscopy
- Patent number 12,152,993
- Issue date Nov 26, 2024
- Nova Ltd.
- Eyal Hollander
- G01 - MEASURING TESTING
Information Patent Grant
Raman spectroscopy based measurements in patterned structures
- Patent number 12,066,385
- Issue date Aug 20, 2024
- Nova Ltd.
- Gilad Barak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hybrid metrology method and system
- Patent number 12,025,560
- Issue date Jul 2, 2024
- Gilad Barak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical technique for material characterization
- Patent number 11,927,481
- Issue date Mar 12, 2024
- Nova Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Raman spectroscopy based measurement system
- Patent number 11,906,434
- Issue date Feb 20, 2024
- Nova Ltd.
- Yonatan Oren
- G01 - MEASURING TESTING
Information Patent Grant
Accurate raman spectroscopy
- Patent number 11,860,104
- Issue date Jan 2, 2024
- Nova Ltd.
- Eyal Hollander
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for broadband photoreflectance spectroscopy
- Patent number 11,802,829
- Issue date Oct 31, 2023
- Nova Ltd.
- Yonatan Oren
- G01 - MEASURING TESTING
Information Patent Grant
Accurate Raman spectroscopy
- Patent number 11,740,183
- Issue date Aug 29, 2023
- Nova Ltd.
- Elad Schleifer
- G01 - MEASURING TESTING
Information Patent Grant
Optical technique for material characterization
- Patent number 11,543,294
- Issue date Jan 3, 2023
- Nova Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Accurate Raman spectroscopy
- Patent number 11,415,519
- Issue date Aug 16, 2022
- Nova Ltd.
- Eyal Hollander
- G01 - MEASURING TESTING
Information Patent Grant
Raman spectroscopy based measurement system
- Patent number 11,293,871
- Issue date Apr 5, 2022
- Nova Ltd.
- Yonatan Oren
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Raman spectroscopy based measurements in patterned structures
- Patent number 11,275,027
- Issue date Mar 15, 2022
- Nova Ltd.
- Gilad Barak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hybrid metrology method and system
- Patent number 11,150,190
- Issue date Oct 19, 2021
- Nova Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid metrology method and system
- Patent number 10,732,116
- Issue date Aug 4, 2020
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad Barak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Raman spectroscopy based measurements in patterned structures
- Patent number 10,564,106
- Issue date Feb 18, 2020
- Nova Measuring Instruments Ltd.
- Gilad Barak
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
HYBRID METROLOGY METHOD AND SYSTEM
- Publication number 20250003882
- Publication date Jan 2, 2025
- NOVA LTD
- GILAD BARAK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RAMAN SPECTROSCOPY BASED MEASUREMENT SYSTEM
- Publication number 20240302284
- Publication date Sep 12, 2024
- NOVA LTD
- Yonatan OREN
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL TECHNIQUE FOR MATERIAL CHARACTERIZATION
- Publication number 20240295436
- Publication date Sep 5, 2024
- NOVA LTD
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
ACCURATE RAMAN SPECTROSCOPY
- Publication number 20240210322
- Publication date Jun 27, 2024
- NOVA LTD
- Eyal Hollander
- G01 - MEASURING TESTING
Information Patent Application
ACCURATE RAMAN SPECTROSCOPY
- Publication number 20240085333
- Publication date Mar 14, 2024
- NOVA LTD
- Elad Schleifer
- G01 - MEASURING TESTING
Information Patent Application
ACCURATE RAMAN SPECTROSCOPY
- Publication number 20240019375
- Publication date Jan 18, 2024
- NOVA LTD
- Eyal Hollander
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR OPTICAL METROLOGY
- Publication number 20230296436
- Publication date Sep 21, 2023
- NOVA LTD
- Yonatan OREN
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL TECHNIQUE FOR MATERIAL CHARACTERIZATION
- Publication number 20230296434
- Publication date Sep 21, 2023
- NOVA LTD
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
ACCURATE RAMAN SPECTROSCOPY
- Publication number 20230168200
- Publication date Jun 1, 2023
- NOVA LTD
- Eyal Hollander
- G01 - MEASURING TESTING
Information Patent Application
ACCURATE RAMAN SPECTROSCOPY
- Publication number 20230044886
- Publication date Feb 9, 2023
- NOVA MEASURING INSTRUMENTS LTD.
- Elad Schleifer
- G01 - MEASURING TESTING
Information Patent Application
COMBINED OCD AND PHOTOREFLECTANCE METHOD AND SYSTEM
- Publication number 20230035404
- Publication date Feb 2, 2023
- NOVA LTD
- Yonatan OREN
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR BROADBAND PHOTOREFLECTANCE SPECTROSCOPY
- Publication number 20230003637
- Publication date Jan 5, 2023
- NOVA LTD
- Yonatan OREN
- G01 - MEASURING TESTING
Information Patent Application
RAMAN SPECTROSCOPY BASED MEASUREMENT SYSTEM
- Publication number 20220373465
- Publication date Nov 24, 2022
- NOVA MEASURING INSTRUMENTS LTD.
- Yonatan OREN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
RAMAN SPECTROSCOPY BASED MEASUREMENTS IN PATTERNED STRUCTURES
- Publication number 20220326159
- Publication date Oct 13, 2022
- NOVA LTD
- Gilad Barak
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
HYBRID METROLOGY METHOD AND SYSTEM
- Publication number 20220120690
- Publication date Apr 21, 2022
- NOVA LTD
- GILAD BARAK
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
OPTICAL TECHNIQUE FOR MATERIAL CHARACTERIZATION
- Publication number 20210293618
- Publication date Sep 23, 2021
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Application
ACCURATE RAMAN SPECTROSCOPY
- Publication number 20210223179
- Publication date Jul 22, 2021
- NOVA MEASURING INSTRUMENTS LTD.
- Eyal Hollander
- G01 - MEASURING TESTING
Information Patent Application
RAMAN SPECTROSCOPY BASED MEASUREMENT SYSTEM
- Publication number 20210164906
- Publication date Jun 3, 2021
- NOVA MEASURING INSTRUMENTS LTD.
- Yonatan OREN
- G01 - MEASURING TESTING
Information Patent Application
HYBRID METROLOGY METHOD AND SYSTEM
- Publication number 20210003508
- Publication date Jan 7, 2021
- NOVA MEASURING INSTRUMENTS LTD.
- GILAD BARAK
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
RAMAN SPECTROSCOPY BASED MEASUREMENTS IN PATTERNED STRUCTURES
- Publication number 20200256799
- Publication date Aug 13, 2020
- NOVA MEASURING INSTRUMENTS LTD.
- GILAD BARAK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RAMAN SPECTROSCOPY BASED MEASUREMENTS IN PATTERNED STRUCTURES
- Publication number 20180372644
- Publication date Dec 27, 2018
- NOVA MEASURING INSTRUMENTS LTD.
- GILAD BARAK
- G01 - MEASURING TESTING
Information Patent Application
HYBRID METROLOGY METHOD AND SYSTEM
- Publication number 20180372645
- Publication date Dec 27, 2018
- NOVA MEASURING INSTRUMENTS LTD.
- GILAD BARAK
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

YONATAN OREN

Person

Patents Grantslast 30 patents

Accurate Raman spectroscopy

Accurate Raman spectroscopy

Raman spectroscopy based measurements in patterned structures

Hybrid metrology method and system

Optical technique for material characterization

Raman spectroscopy based measurement system

Accurate raman spectroscopy

Method and system for broadband photoreflectance spectroscopy

Accurate Raman spectroscopy

Optical technique for material characterization

Accurate Raman spectroscopy

Raman spectroscopy based measurement system

Raman spectroscopy based measurements in patterned structures

Hybrid metrology method and system

Hybrid metrology method and system

Raman spectroscopy based measurements in patterned structures

Patents Applicationslast 30 patents

HYBRID METROLOGY METHOD AND SYSTEM

RAMAN SPECTROSCOPY BASED MEASUREMENT SYSTEM

OPTICAL TECHNIQUE FOR MATERIAL CHARACTERIZATION

ACCURATE RAMAN SPECTROSCOPY

ACCURATE RAMAN SPECTROSCOPY

ACCURATE RAMAN SPECTROSCOPY

SYSTEMS AND METHODS FOR OPTICAL METROLOGY

OPTICAL TECHNIQUE FOR MATERIAL CHARACTERIZATION

ACCURATE RAMAN SPECTROSCOPY

ACCURATE RAMAN SPECTROSCOPY

COMBINED OCD AND PHOTOREFLECTANCE METHOD AND SYSTEM

METHOD AND SYSTEM FOR BROADBAND PHOTOREFLECTANCE SPECTROSCOPY

RAMAN SPECTROSCOPY BASED MEASUREMENT SYSTEM

RAMAN SPECTROSCOPY BASED MEASUREMENTS IN PATTERNED STRUCTURES

HYBRID METROLOGY METHOD AND SYSTEM

OPTICAL TECHNIQUE FOR MATERIAL CHARACTERIZATION

ACCURATE RAMAN SPECTROSCOPY

RAMAN SPECTROSCOPY BASED MEASUREMENT SYSTEM

HYBRID METROLOGY METHOD AND SYSTEM

RAMAN SPECTROSCOPY BASED MEASUREMENTS IN PATTERNED STRUCTURES

RAMAN SPECTROSCOPY BASED MEASUREMENTS IN PATTERNED STRUCTURES

HYBRID METROLOGY METHOD AND SYSTEM