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Yong-Fa A. Wang
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Coppell, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Methods, apparatuses, and systems for calibrating gas detecting app...
Patent number
11,982,658
Issue date
May 14, 2024
Honeywell International Inc.
Xiangcai He
G01 - MEASURING TESTING
Information
Patent Grant
Flow sensing device
Patent number
11,768,093
Issue date
Sep 26, 2023
Honeywell International Inc.
Scott Edward Beck
G01 - MEASURING TESTING
Information
Patent Grant
Thermopile-based flow sensing device
Patent number
11,747,184
Issue date
Sep 5, 2023
Honeywell International Inc.
Robert Higashi
G01 - MEASURING TESTING
Information
Patent Grant
Flow sensing device
Patent number
11,262,224
Issue date
Mar 1, 2022
Honeywell International Inc.
Scott Edward Beck
G01 - MEASURING TESTING
Information
Patent Grant
Method of depositing electrodes and electrolyte on microelectromech...
Patent number
11,169,110
Issue date
Nov 9, 2021
Honeywell International Inc.
Keith Francis Edwin Pratt
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Electrochemical gas sensor constructed with MEMS fabrication techno...
Patent number
10,996,190
Issue date
May 4, 2021
Honeywell International Inc.
Scott Edward Beck
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Thermophile-based flow sensing device
Patent number
10,775,217
Issue date
Sep 15, 2020
Honeywell International Inc.
Robert Higashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sensor with improved thermal stability
Patent number
8,356,514
Issue date
Jan 22, 2013
Honeywell International Inc.
Yong-Fa Wang
G01 - MEASURING TESTING
Information
Patent Grant
Creating novel structures using deep trenching of oriented silicon...
Patent number
7,932,182
Issue date
Apr 26, 2011
Honeywell International Inc.
Yong-Fa A. Wang
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Non-gated thyristor device
Patent number
6,781,161
Issue date
Aug 24, 2004
Teccor Electronics, LP
Elmer L. Turner
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR APPLYING A CAP LAYER TO PROTECT ELECTRICAL COMPONENTS OF...
Publication number
20240079240
Publication date
Mar 7, 2024
Honeywell International Inc.
Yong-Fa Alan Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
THERMOPILE-BASED FLOW SENSING DEVICE
Publication number
20230358586
Publication date
Nov 9, 2023
Honeywell International Inc.
Robert Higashi
G01 - MEASURING TESTING
Information
Patent Application
GAS DETECTING APPARATUSES WITH INTEGRATED FLOW REGULATING COMPONENTS
Publication number
20230226468
Publication date
Jul 20, 2023
Honeywell International Inc.
Zuohua LI
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
METHODS, APPARATUSES, AND SYSTEMS FOR CALIBRATING GAS DETECTING APP...
Publication number
20220404324
Publication date
Dec 22, 2022
Honeywell International Inc.
Xiangcai HE
G01 - MEASURING TESTING
Information
Patent Application
FLOW SENSING DEVICE
Publication number
20220136882
Publication date
May 5, 2022
Honeywell International Inc.
Scott Edward BECK
G01 - MEASURING TESTING
Information
Patent Application
FLOW SENSING DEVICE
Publication number
20210396562
Publication date
Dec 23, 2021
HONEYWELL INTERNATIONAL INC.
Scott Edward BECK
G01 - MEASURING TESTING
Information
Patent Application
THERMOPILE-BASED FLOW SENSING DEVICE
Publication number
20200370938
Publication date
Nov 26, 2020
Honeywell Internatinal Inc.
Robert Higashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
HIGH SURFACE AREA ELECTRODE FOR ELECTROCHEMICAL SENSOR
Publication number
20200333284
Publication date
Oct 22, 2020
HONEYWELL INTERNATIONAL INC.
Scott Edward Beck
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
ELECTROCHEMICAL GAS SENSOR CONSTRUCTED WITH MEMS FABRICATION TECHNO...
Publication number
20190137440
Publication date
May 9, 2019
HONEYWELL INTERNATIONAL INC.
Scott Edward BECK
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
METHOD OF DEPOSITING ELECTRODES AND ELECTROLYTE ON MICROELECTROMECH...
Publication number
20190128835
Publication date
May 2, 2019
HONEYWELL INTERNATIONAL INC.
Keith Francis Edwin PRATT
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
SENSOR ELEMENT WITH ENGINEERED SILICIDE
Publication number
20130068013
Publication date
Mar 21, 2013
Honeywell International Inc.
Scott Edward Beck
G01 - MEASURING TESTING
Information
Patent Application
SENSOR WITH IMPROVED THERMAL STABILITY
Publication number
20120180563
Publication date
Jul 19, 2012
Honeywell International Inc.
Yong-Fa Wang
G01 - MEASURING TESTING
Information
Patent Application
ROBUST SENSOR WITH TOP CAP
Publication number
20110252882
Publication date
Oct 20, 2011
Honeywell International Inc.
Scott Edward Beck
G01 - MEASURING TESTING
Information
Patent Application
Single crystal based through the wafer connections technical field
Publication number
20070042563
Publication date
Feb 22, 2007
Honeywell International Inc.
Yong-Fa A. Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Creating novel structures using deep trenching of oriented silicon...
Publication number
20070042606
Publication date
Feb 22, 2007
Honeywell International Inc.
Yong-Fa A. Wang
B81 - MICRO-STRUCTURAL TECHNOLOGY