Yong-Fen Hsieh

Person

Hsinchu, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Specimen preparation for transmission electron microscopy
- Patent number 9,384,942
- Issue date Jul 5, 2016
- National Health Research Institutes
- Yong-fen Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Specimen preparation for transmission electron microscopy
- Patent number 8,969,827
- Issue date Mar 3, 2015
- Materials Analysis Technology (US) Corp.
- Yong-Fen Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
On-chip thin film Zernike phase plate and applications thereof
- Patent number 8,791,416
- Issue date Jul 29, 2014
- Academia Sinica
- Yunn-Shin Shiue
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method of fabricating dynamic random access memory
- Patent number 6,228,711
- Issue date May 8, 2001
- United Microelectronics Corp.
- Yong-Fen Hsieh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to inhibit the formation of ion implantation induced edge de...
- Patent number 5,989,986
- Issue date Nov 23, 1999
- United Microelectronics Corp.
- Yong-Fen Hsieh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process of forming a field effect transistor without spacer mask ed...
- Patent number 5,956,590
- Issue date Sep 21, 1999
- United Microelectronics Corp.
- Yong-Fen Hsieh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming precisely cross-sectioned electron-transparent sa...
- Patent number 5,940,678
- Issue date Aug 17, 1999
- United Microelectronics Corp.
- Yih-Yuh Doong
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing semiconductor components having a titanium...
- Patent number 5,897,373
- Issue date Apr 27, 1999
- United Microelectronics Corp.
- Yuan-Ching Peng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field effect transistor without spacer mask edge defects
- Patent number 5,482,876
- Issue date Jan 9, 1996
- United Microelectronics Corporation
- Yong-Fen Hsieh
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SPECIMEN PREPARATION FOR TRANSMISSION ELECTRON MICROSCOPY
- Publication number 20150194288
- Publication date Jul 9, 2015
- National Health Research Institutes
- Yong-fen Hsieh
- G01 - MEASURING TESTING
Information Patent Application
ON-CHIP THIN FILM ZERNIKE PHASE PLATE AND APPLICATIONS THEREOF
- Publication number 20140166880
- Publication date Jun 19, 2014
- Academia Sinica
- YUNN-SHIN SHIUE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECIMEN PREPARATION FOR TEM
- Publication number 20140007709
- Publication date Jan 9, 2014
- National Health Research Institutes
- Yong-Fen HSIEH
- G01 - MEASURING TESTING

Yong-Fen Hsieh

Person

Patents Grantslast 30 patents

Specimen preparation for transmission electron microscopy

Specimen preparation for transmission electron microscopy

On-chip thin film Zernike phase plate and applications thereof

Method of fabricating dynamic random access memory

Method to inhibit the formation of ion implantation induced edge de...

Process of forming a field effect transistor without spacer mask ed...

Method of forming precisely cross-sectioned electron-transparent sa...

Method of manufacturing semiconductor components having a titanium...

Field effect transistor without spacer mask edge defects

Patents Applicationslast 30 patents

SPECIMEN PREPARATION FOR TRANSMISSION ELECTRON MICROSCOPY

ON-CHIP THIN FILM ZERNIKE PHASE PLATE AND APPLICATIONS THEREOF

SPECIMEN PREPARATION FOR TEM