Yong-Ho KONG

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Gyeonggi-do, KR

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device with test mode circuit
- Patent number 10,036,770
- Issue date Jul 31, 2018
- SK Hynix Inc.
- Yong-Ho Kong
- G01 - MEASURING TESTING
Information Patent Grant
Memory device
- Patent number 9,330,793
- Issue date May 3, 2016
- SK Hynix Inc.
- Seon-Ki Cho
- G11 - INFORMATION STORAGE
Information Patent Grant
Fail address storage circuit, redundancy control circuit, method fo...
- Patent number 9,287,007
- Issue date Mar 15, 2016
- SK Hynix Inc.
- Yong-Ho Kong
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device with test mode circuit
- Patent number 9,201,111
- Issue date Dec 1, 2015
- SK Hynix Inc.
- Yong-Ho Kong
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device, semiconductor repair system including the sam...
- Patent number 9,202,596
- Issue date Dec 1, 2015
- SK Hynix Inc.
- Seon-Ki Cho
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE WITH TEST MODE CIRCUIT
- Publication number 20160047854
- Publication date Feb 18, 2016
- SK hynix Inc.
- Yong-Ho KONG
- G01 - MEASURING TESTING
Information Patent Application
MEMORY DEVICE
- Publication number 20150332790
- Publication date Nov 19, 2015
- SK HYNIX INC.
- Seon-Ki CHO
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE, SEMICONDUCTOR REPAIR SYSTEM INCLUDING THE SAM...
- Publication number 20150310939
- Publication date Oct 29, 2015
- SK HYNIX INC.
- Seon-Ki CHO
- G11 - INFORMATION STORAGE
Information Patent Application
FUSE REPAIR DEVICE
- Publication number 20140169059
- Publication date Jun 19, 2014
- SK HYNIX INC.
- Yong-Ho KONG
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE WITH TEST MODE CIRCUIT
- Publication number 20140062514
- Publication date Mar 6, 2014
- SK HYNIX INC.
- Yong-Ho KONG
- G01 - MEASURING TESTING
Information Patent Application
FAIL ADDRESS STORAGE CIRCUIT, REDUNDANCY CONTROL CIRCUIT, METHOD FO...
- Publication number 20130182517
- Publication date Jul 18, 2013
- Yong-Ho KONG
- G11 - INFORMATION STORAGE
Information Patent Application
DEFECTIVE MEMORY CELL ADDRESS STORAGE CIRCUIT AND REDUNDANCY CONTRO...
- Publication number 20120155202
- Publication date Jun 21, 2012
- Yong-Ho KONG
- G11 - INFORMATION STORAGE