Yong Wang

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Fort Collins, CO, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for integrating subcircuit models in an integrate...
- Patent number 7,143,022
- Issue date Nov 28, 2006
- Hewlett-Packard Development Company, L.P.
- Yong Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for generating node level bypass capacitor models
- Patent number 7,143,389
- Issue date Nov 28, 2006
- Hewlett-Packard Development Company, L.P.
- Yong Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for analyzing circuits
- Patent number 7,109,047
- Issue date Sep 19, 2006
- Hewlett-Packard Development Company, L.P.
- Yong V. Wang
- G01 - MEASURING TESTING
Information Patent Grant
System and method for determining S-parameters of a connected struc...
- Patent number 7,088,110
- Issue date Aug 8, 2006
- Hewlett-Packard Development Company, L.P.
- Karl Joseph Bois
- G01 - MEASURING TESTING
Information Patent Grant
System and method for determining S-parameters using a load
- Patent number 6,998,833
- Issue date Feb 14, 2006
- Hewlett-Packard Development Company, L.P.
- Yong Wang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Systems and methods for generating node level bypass capacitor models
- Publication number 20060026542
- Publication date Feb 2, 2006
- Yong Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for determining S-parameters
- Publication number 20050110502
- Publication date May 26, 2005
- Yong Wang
- G01 - MEASURING TESTING
Information Patent Application
System and method for determining S-parameters using a load
- Publication number 20050093554
- Publication date May 5, 2005
- Yong Wang
- G01 - MEASURING TESTING