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Yong-Woo Heo
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Yongin-city, KR
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for automatically measuring the concentration...
Patent number
7,081,182
Issue date
Jul 25, 2006
Samsung Electronics Co., Ltd.
Jae-Jun Ryu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus and method for collecting metallic impurity on a semicond...
Patent number
6,960,265
Issue date
Nov 1, 2005
Samsung Electronics Co., Ltd.
Yong-Woo Heo
G01 - MEASURING TESTING
Information
Patent Grant
Etchant used in the manufacture of semiconductor devices and etchin...
Patent number
6,613,693
Issue date
Sep 2, 2003
Samsung Electronics Co., Ltd.
Yong-woo Heo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Wet etching system for manufacturing semiconductor devices and wet...
Patent number
6,548,419
Issue date
Apr 15, 2003
Samsung Electronics Co., Ltd.
Yong-woo Heo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Wet etching system for manufacturing semiconductor devices
Patent number
6,398,904
Issue date
Jun 4, 2002
Samsung Electronics Co., Ltd.
Yong-woo Heo
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Etchant used in the manufacture of semiconductor devices and etchin...
Publication number
20030203632
Publication date
Oct 30, 2003
Yong-woo Heo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and apparatus for automatically measuring the concentration...
Publication number
20030054576
Publication date
Mar 20, 2003
Jae-Jun Ryu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Apparatus and method for collecting metallic impurity on a semicond...
Publication number
20020134406
Publication date
Sep 26, 2002
SAMSUNG ELECTRONICS CO., LTD.
Yong-Woo Heo
G01 - MEASURING TESTING
Information
Patent Application
Wet etching system for manufacturing semiconductor devices and wet...
Publication number
20020058423
Publication date
May 16, 2002
Yong-Woo Heo
H01 - BASIC ELECTRIC ELEMENTS