Yong Zhang

Person

Cupertino, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Frequency domain enhancement of low-SNR flat residue/stain defects...
- Patent number 11,798,153
- Issue date Oct 24, 2023
- KLA Corporation
- Chaohong Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection of noisy patterned features
- Patent number 11,631,169
- Issue date Apr 18, 2023
- KLA Corp.
- Tao Luo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for correlating optical images with scanning elec...
- Patent number 11,244,442
- Issue date Feb 8, 2022
- KLA Corporation
- Hucheng Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for defining flexible regions on a sample during...
- Patent number 11,127,136
- Issue date Sep 21, 2021
- KLA Corporation
- Yong Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Deep learning networks for nuisance filtering
- Patent number 11,087,449
- Issue date Aug 10, 2021
- KLA Corp.
- Tong Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Adaptive care areas for die-die inspection
- Patent number 10,997,710
- Issue date May 4, 2021
- KLA-Tencor Corporation
- Himanshu Vajaria
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Super-resolution defect review image generation through generative...
- Patent number 10,949,964
- Issue date Mar 16, 2021
- KLA Corporation
- Anuj Pandey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for wafer inspection with a noise boundary threshold
- Patent number 10,533,953
- Issue date Jan 14, 2020
- KLA-Tencor Corporation
- Xuguang Jiang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-step image alignment method for large offset die-die inspection
- Patent number 10,522,376
- Issue date Dec 31, 2019
- KLA-Tencor Corporation
- Jan Lauber
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for correlating optical images with scanning elec...
- Patent number 10,410,338
- Issue date Sep 10, 2019
- KLA-Tencor Corporation
- Hucheng Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect detection on transparent or translucent wafers
- Patent number 10,402,963
- Issue date Sep 3, 2019
- KLA-Tencor Corporation
- Xuguang Jiang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for defocus detection
- Patent number 10,372,113
- Issue date Aug 6, 2019
- KLA-Tencor Corporation
- Xuguang Jiang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System, method and computer program product for identifying fabrica...
- Patent number 10,043,265
- Issue date Aug 7, 2018
- KLA-Tencor Corporation
- Tong Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Context-based inspection for dark field inspection
- Patent number 9,715,725
- Issue date Jul 25, 2017
- KLA-Tencor Corp.
- Yong Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Segmentation for wafer inspection
- Patent number 8,831,334
- Issue date Sep 9, 2014
- KLA-Tencor Corp.
- Tao Luo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detecting defects on a wafer
- Patent number 8,775,101
- Issue date Jul 8, 2014
- KLA-Tencor Corp.
- Junqing Huang
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device property extraction, generation, visualization...
- Patent number 8,611,639
- Issue date Dec 17, 2013
- KLA-Tencor Technologies Corp.
- Ashok Kulkarni
- G01 - MEASURING TESTING
Information Patent Grant
Computer-implemented methods, carrier media, and systems for creati...
- Patent number 8,135,204
- Issue date Mar 13, 2012
- KLA-Tencor Technologies Corp.
- Chien-Huei (Adam) Chen
- G01 - MEASURING TESTING
Information Patent Grant
Computer-implemented methods, carrier media, and systems for select...
- Patent number 8,049,877
- Issue date Nov 1, 2011
- KLA-Tencor Corp.
- Richard Wallingford
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Inspection of Noisy Patterned Features
- Publication number 20220036528
- Publication date Feb 3, 2022
- KLA Corporation
- Tao Luo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and Method for Defining Flexible Regions on a Sample During...
- Publication number 20210174483
- Publication date Jun 10, 2021
- KLA Corporation
- Yong Zhang
- G01 - MEASURING TESTING
Information Patent Application
Deep Learning Networks for Nuisance Filtering
- Publication number 20210125325
- Publication date Apr 29, 2021
- KLA Corporation
- Tong Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FREQUENCY DOMAIN ENHANCEMENT OF LOW-SNR FLAT RESIDUE/STAIN DEFECTS...
- Publication number 20210104034
- Publication date Apr 8, 2021
- KLA Corporation
- Chaohong Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Super-Resolution Defect Review Image Generation Through Generative...
- Publication number 20200098101
- Publication date Mar 26, 2020
- KLA-Tencor Corporation
- Anuj Pandey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and System for Correlating Optical Images with Scanning Elec...
- Publication number 20190333206
- Publication date Oct 31, 2019
- KLA-Tencor Corporation
- Hucheng Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-STEP IMAGE ALIGNMENT METHOD FOR LARGE OFFSET DIE-DIE INSPECTION
- Publication number 20190122913
- Publication date Apr 25, 2019
- KLA-Tencor Corporation
- Jan Lauber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADAPTIVE CARE AREAS FOR DIE-DIE INSPECTION
- Publication number 20190114758
- Publication date Apr 18, 2019
- KLA-Tencor Corporation
- Himanshu Vajaria
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT DETECTION ON TRANSPARENT OR TRANSLUCENT WAFERS
- Publication number 20190066284
- Publication date Feb 28, 2019
- KLA-Tencor Corporation
- Xuguang Jiang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for Defocus Detection
- Publication number 20180088560
- Publication date Mar 29, 2018
- KLA-Tencor Corporation
- Xuguang Jiang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and Method for Wafer Inspection with a Noise Boundary Threshold
- Publication number 20170284944
- Publication date Oct 5, 2017
- KLA-Tencor Corporation
- Xuguang Jiang
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR IDENTIFYING FABRICA...
- Publication number 20170270652
- Publication date Sep 21, 2017
- KLA-Tencor Corporation
- Tong Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Context-Based Inspection for Dark Field Inspection
- Publication number 20150178907
- Publication date Jun 25, 2015
- KLA-Tencor Corporation
- Yong Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and System for Correlating Optical Images with Scanning Elec...
- Publication number 20150125065
- Publication date May 7, 2015
- KLA-Tencor Corporation
- Hucheng Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Segmentation for Wafer Inspection
- Publication number 20130188859
- Publication date Jul 25, 2013
- KLA-Tencor Corporation
- Tao Luo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTING DEFECTS ON A WAFER
- Publication number 20130035876
- Publication date Feb 7, 2013
- KLA-Tencor Corporation
- Junqing Huang
- G01 - MEASURING TESTING
Information Patent Application
COMPUTER-IMPLEMENTED METHODS, CARRIER MEDIA, AND SYSTEMS FOR SELECT...
- Publication number 20090284733
- Publication date Nov 19, 2009
- Richard Wallingford
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE PROPERTY EXTRACTION, GENERATION, VISUALIZATION...
- Publication number 20090037134
- Publication date Feb 5, 2009
- Ashok Kulkarni
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Frequency domain enhancement of low-SNR flat residue/stain defects...

Inspection of noisy patterned features

Method and system for correlating optical images with scanning elec...

System and method for defining flexible regions on a sample during...

Deep learning networks for nuisance filtering

Adaptive care areas for die-die inspection

Super-resolution defect review image generation through generative...

System and method for wafer inspection with a noise boundary threshold

Multi-step image alignment method for large offset die-die inspection

Method and system for correlating optical images with scanning elec...

Defect detection on transparent or translucent wafers

Method for defocus detection

System, method and computer program product for identifying fabrica...

Context-based inspection for dark field inspection

Segmentation for wafer inspection

Detecting defects on a wafer

Semiconductor device property extraction, generation, visualization...

Computer-implemented methods, carrier media, and systems for creati...

Computer-implemented methods, carrier media, and systems for select...

Patents Applicationslast 30 patents

Inspection of Noisy Patterned Features

System and Method for Defining Flexible Regions on a Sample During...

Deep Learning Networks for Nuisance Filtering

FREQUENCY DOMAIN ENHANCEMENT OF LOW-SNR FLAT RESIDUE/STAIN DEFECTS...

Super-Resolution Defect Review Image Generation Through Generative...

Method and System for Correlating Optical Images with Scanning Elec...

MULTI-STEP IMAGE ALIGNMENT METHOD FOR LARGE OFFSET DIE-DIE INSPECTION

ADAPTIVE CARE AREAS FOR DIE-DIE INSPECTION

DEFECT DETECTION ON TRANSPARENT OR TRANSLUCENT WAFERS

Method for Defocus Detection

System and Method for Wafer Inspection with a Noise Boundary Threshold

SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR IDENTIFYING FABRICA...

Context-Based Inspection for Dark Field Inspection

Method and System for Correlating Optical Images with Scanning Elec...

Segmentation for Wafer Inspection

DETECTING DEFECTS ON A WAFER

COMPUTER-IMPLEMENTED METHODS, CARRIER MEDIA, AND SYSTEMS FOR SELECT...

SEMICONDUCTOR DEVICE PROPERTY EXTRACTION, GENERATION, VISUALIZATION...