Yongbum Cuevas

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Los Gatos, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for measurement of electromigration in semiconductor integra...
- Patent number 6,784,000
- Issue date Aug 31, 2004
- QualiTau, Inc.
- Robert Sikora
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High temperature minimal (zero) insertion force socket
- Patent number 6,179,640
- Issue date Jan 30, 2001
- Qualitau, Inc.
- Robert Sikora
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
Method for measurement of electromigration in semiconductor integra...
- Publication number 20020022282
- Publication date Feb 21, 2002
- Robert Sikora
- H01 - BASIC ELECTRIC ELEMENTS