Membership
Tour
Register
Log in
Yongchul CHO
Follow
Person
Suwon-si, KR
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Lidar apparatus having wide-viewing angle
Patent number
12,210,097
Issue date
Jan 28, 2025
Samsung Electronics Co., Ltd.
Yongchul Cho
G01 - MEASURING TESTING
Information
Patent Grant
LiDAR device and method of operating the same
Patent number
12,000,963
Issue date
Jun 4, 2024
Samsung Electronics Co., Ltd.
Jungwoo Kim
G01 - MEASURING TESTING
Information
Patent Grant
Optical scanner and LIDAR system including the same
Patent number
11,933,894
Issue date
Mar 19, 2024
Samsung Electronics Co., Ltd.
Yongchul Cho
G02 - OPTICS
Information
Patent Grant
Optical device and LiDAR system including the same
Patent number
11,796,678
Issue date
Oct 24, 2023
Samsung Electronics Co., Ltd.
Yongchul Cho
G01 - MEASURING TESTING
Information
Patent Grant
Light detection and ranging device and method of driving the same
Patent number
11,536,806
Issue date
Dec 27, 2022
Samsung Electronics Co., Ltd.
Jungwoo Kim
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for acquiring distance information
Patent number
10,545,237
Issue date
Jan 28, 2020
Samsung Electronics Co., Ltd.
Yongchul Cho
G01 - MEASURING TESTING
Information
Patent Grant
3D camera and method of measuring transmittance using the same
Patent number
10,362,294
Issue date
Jul 23, 2019
Samsung Electronics Co., Ltd.
Yongchul Cho
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method and apparatus for generating depth image
Patent number
10,264,240
Issue date
Apr 16, 2019
Samsung Electronics Co., Ltd.
Myungjae Jeon
G01 - MEASURING TESTING
Information
Patent Grant
Optical device including three-coupled quantum well structure
Patent number
9,841,617
Issue date
Dec 12, 2017
Gwangju Institute of Science and Technology
Yongchul Cho
B82 - NANO-TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
LIDAR DEVICE
Publication number
20230119426
Publication date
Apr 20, 2023
Samsung Electronics Co., Ltd.
Yongchul CHO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LiDAR DEVICE AND ELECTRONIC APPARATUS INCLUDING THE SAME
Publication number
20220357425
Publication date
Nov 10, 2022
Samsung Electronics Co., Ltd.
Jungwoo KIM
G01 - MEASURING TESTING
Information
Patent Application
LIGHT DETECTION DEVICE, LIDAR DEVICE INCLUDING THE SAME, AND METHOD...
Publication number
20220155442
Publication date
May 19, 2022
Samsung Electronics Co., Ltd.
Tatsuhiro OTSUKA
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
LIDAR APPARATUS HAVING WIDE-VIEWING ANGLE
Publication number
20220113406
Publication date
Apr 14, 2022
Samsung Electronics Co., Ltd.
Yongchul CHO
G01 - MEASURING TESTING
Information
Patent Application
LIDAR DEVICE AND DRIVING METHOD THEREOF
Publication number
20220075034
Publication date
Mar 10, 2022
Samsung Electronics Co., Ltd.
Jungwoo KIM
G01 - MEASURING TESTING
Information
Patent Application
LiDAR DEVICE AND METHOD OF OPERATING THE SAME
Publication number
20210208258
Publication date
Jul 8, 2021
Samsung Electronics Co., Ltd.
Jungwoo KIM
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL DEVICE AND LIDAR SYSTEM INCLUDING THE SAME
Publication number
20210109222
Publication date
Apr 15, 2021
Samsung Electronics Co., Ltd.
Yongchul CHO
G01 - MEASURING TESTING
Information
Patent Application
LIGHT DETECTION AND RANGING DEVICE AND METHOD OF DRIVING THE SAME
Publication number
20200174104
Publication date
Jun 4, 2020
Samsung Electronics Co., Ltd.
Jungwoo KIM
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL SCANNER AND LIDAR SYSTEM INCLUDING THE SAME
Publication number
20200049819
Publication date
Feb 13, 2020
Samsung Electronics Co., Ltd.
Yongchul CHO
G02 - OPTICS
Information
Patent Application
METHOD AND DEVICE FOR ACQUIRING DISTANCE INFORMATION
Publication number
20180052231
Publication date
Feb 22, 2018
Samsung Electronics Co., Ltd.
Yongchul CHO
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR GENERATING DEPTH IMAGE
Publication number
20170127047
Publication date
May 4, 2017
Samsung Electronics Co., Ltd.
Myungjae JEON
G01 - MEASURING TESTING
Information
Patent Application
3D CAMERA AND METHOD OF MEASURING TRANSMITTANCE USING THE SAME
Publication number
20170118455
Publication date
Apr 27, 2017
Samsung Electronics Co., Ltd.
Yongchul CHO
G02 - OPTICS
Information
Patent Application
OPTICAL DEVICE INCLUDING THREE-COUPLED QUANTUM WELL STRUCTURE
Publication number
20150286078
Publication date
Oct 8, 2015
Gwangju Institute of Science and Technology
Yongchul CHO
B82 - NANO-TECHNOLOGY