Yongchun Xin

Person

Poughkeepsie, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Micro electrical mechanical system (MEMS) valve
- Patent number 11,187,349
- Issue date Nov 30, 2021
- International Business Machines Corporation
- Yongchun Xin
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
MEMS optical liquid level sensor
- Patent number 11,161,110
- Issue date Nov 2, 2021
- International Business Machines Corporation
- Jonathan Fry
- G01 - MEASURING TESTING
Information Patent Grant
Micro electrical mechanical system (MEMS) multiplexing mixing
- Patent number 10,898,871
- Issue date Jan 26, 2021
- International Business Machines Corporation
- Jonathan Fry
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Micro electrical mechanical system (MEMS) valve
- Patent number 10,612,691
- Issue date Apr 7, 2020
- International Business Machines Corporation
- Yongchun Xin
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Self-cleaning liquid level sensor
- Patent number 10,551,240
- Issue date Feb 4, 2020
- International Business Machines Corporation
- Jonathan Fry
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
MEMS optical sensor
- Patent number 10,458,909
- Issue date Oct 29, 2019
- International Business Machines Corporation
- Jonathan Fry
- G02 - OPTICS
Information Patent Grant
Micro electrical mechanical system (MEMS) valve
- Patent number 10,415,721
- Issue date Sep 17, 2019
- International Business Machines Corporation
- Yongchun Xin
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
LCR test circuit structure for detecting metal gate defect conditions
- Patent number 9,780,007
- Issue date Oct 3, 2017
- GLOBALFOUNDRIES Inc.
- Xu Ouyang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer probing system including pressure sensing and c...
- Patent number 9,702,930
- Issue date Jul 11, 2017
- International Business Machines Corporation
- Robert D. Edwards
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing in a semiconductor device a low resistance...
- Patent number 9,559,051
- Issue date Jan 31, 2017
- GlobalFoundries Inc.
- Yongchun Xin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Voltage contrast characterization structures and methods for within...
- Patent number 9,519,210
- Issue date Dec 13, 2016
- International Business Machines Corporation
- Oliver D. Patterson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Pressure sensing and control for semiconductor wafer probing
- Patent number 9,354,252
- Issue date May 31, 2016
- International Business Machines Corporation
- Robert D. Edwards
- G01 - MEASURING TESTING
Information Patent Grant
Pressure sensing and control for semiconductor wafer probing
- Patent number 8,963,567
- Issue date Feb 24, 2015
- International Business Machines Corporation
- Robert D. Edwards
- G01 - MEASURING TESTING
Information Patent Grant
Random coded integrated circuit structures and methods of making ra...
- Patent number 8,803,328
- Issue date Aug 12, 2014
- International Business Machines Corporation
- Yunsheng Song
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Noncontact electrical testing with optical techniques
- Patent number 8,742,782
- Issue date Jun 3, 2014
- International Business Machines Corporation
- Xu Ouyang
- G01 - MEASURING TESTING
Information Patent Grant
Wafer alignment system with optical coherence tomography
- Patent number 8,489,225
- Issue date Jul 16, 2013
- International Business Machines Corporation
- Yongchun Xin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEMS OPTICAL LIQUID LEVEL SENSOR
- Publication number 20200061611
- Publication date Feb 27, 2020
- International Business Machines Corporation
- Jonathan Fry
- G02 - OPTICS
Information Patent Application
MICRO ELECTRICAL MECHANICAL SYSTEM (MEMS) MULTIPLEXING MIXING
- Publication number 20200001257
- Publication date Jan 2, 2020
- International Business Machines Corporation
- Jonathan FRY
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
MICRO ELECTRICAL MECHANICAL SYSTEM (MEMS) VALVE
- Publication number 20190323627
- Publication date Oct 24, 2019
- International Business Machines Corporation
- Yongchun XIN
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
MICRO ELECTRICAL MECHANICAL SYSTEM (MEMS) VALVE
- Publication number 20190219192
- Publication date Jul 18, 2019
- International Business Machines Corporation
- Yongchun XIN
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
MICRO ELECTRICAL MECHANICAL SYSTEM (MEMS) VALVE
- Publication number 20190219193
- Publication date Jul 18, 2019
- International Business Machines Corporation
- Yongchun XIN
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SELF-CLEANING LIQUID LEVEL SENSOR
- Publication number 20190162578
- Publication date May 30, 2019
- International Business Machines Corporation
- Jonathan Fry
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
PRESSURE SENSING AND CONTROL FOR SEMICONDUCTOR WAFER PROBING
- Publication number 20160216321
- Publication date Jul 28, 2016
- International Business Machines Corporation
- Robert D. Edwards
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE CONTRAST CHARACTERIZATION STRUCTURES AND METHODS FOR WITHIN...
- Publication number 20160148849
- Publication date May 26, 2016
- International Business Machines Corporation
- Oliver D. Patterson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PRESSURE SENSING AND CONTROL FOR SEMICONDUCTOR WAFER PROBING
- Publication number 20150145544
- Publication date May 28, 2015
- International Business Machines Corporation
- Robert D. Edwards
- G01 - MEASURING TESTING
Information Patent Application
RANDOM CODED INTEGRATED CIRCUIT STRUCTURES AND METHODS OF MAKING RA...
- Publication number 20140203448
- Publication date Jul 24, 2014
- International Business Machines Corporation
- Yunsheng Song
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LCR TEST CIRCUIT STRUCTURE FOR DETECTING METAL GATE DEFECT CONDITIONS
- Publication number 20130169308
- Publication date Jul 4, 2013
- International Business Machines Corporation
- Xu Ouyang
- G01 - MEASURING TESTING
Information Patent Application
PRESSURE SENSING AND CONTROL FOR SEMICONDUCTOR WAFER PROBING
- Publication number 20130106455
- Publication date May 2, 2013
- International Business Machines Corporation
- Robert D. Edwards
- G01 - MEASURING TESTING
Information Patent Application
NONCONTACT ELECTRICAL TESTING WITH OPTICAL TECHNIQUES
- Publication number 20130027051
- Publication date Jan 31, 2013
- International Business Machines Corporation
- Xu Ouyang
- G01 - MEASURING TESTING
Information Patent Application
WAFER ALIGNMENT SYSTEM WITH OPTICAL COHERENCE TOMOGRAPHY
- Publication number 20120232686
- Publication date Sep 13, 2012
- International Business Machines Corporation
- Yongchun Xin
- G01 - MEASURING TESTING

Yongchun Xin

Person

Patents Grantslast 30 patents

Micro electrical mechanical system (MEMS) valve

MEMS optical liquid level sensor

Micro electrical mechanical system (MEMS) multiplexing mixing

Micro electrical mechanical system (MEMS) valve

Self-cleaning liquid level sensor

MEMS optical sensor

Micro electrical mechanical system (MEMS) valve

LCR test circuit structure for detecting metal gate defect conditions

Semiconductor wafer probing system including pressure sensing and c...

Method for manufacturing in a semiconductor device a low resistance...

Voltage contrast characterization structures and methods for within...

Pressure sensing and control for semiconductor wafer probing

Pressure sensing and control for semiconductor wafer probing

Random coded integrated circuit structures and methods of making ra...

Noncontact electrical testing with optical techniques

Wafer alignment system with optical coherence tomography

Patents Applicationslast 30 patents

MEMS OPTICAL LIQUID LEVEL SENSOR

MICRO ELECTRICAL MECHANICAL SYSTEM (MEMS) MULTIPLEXING MIXING

MICRO ELECTRICAL MECHANICAL SYSTEM (MEMS) VALVE

MICRO ELECTRICAL MECHANICAL SYSTEM (MEMS) VALVE

MICRO ELECTRICAL MECHANICAL SYSTEM (MEMS) VALVE

SELF-CLEANING LIQUID LEVEL SENSOR

PRESSURE SENSING AND CONTROL FOR SEMICONDUCTOR WAFER PROBING

VOLTAGE CONTRAST CHARACTERIZATION STRUCTURES AND METHODS FOR WITHIN...

PRESSURE SENSING AND CONTROL FOR SEMICONDUCTOR WAFER PROBING

RANDOM CODED INTEGRATED CIRCUIT STRUCTURES AND METHODS OF MAKING RA...

LCR TEST CIRCUIT STRUCTURE FOR DETECTING METAL GATE DEFECT CONDITIONS

PRESSURE SENSING AND CONTROL FOR SEMICONDUCTOR WAFER PROBING

NONCONTACT ELECTRICAL TESTING WITH OPTICAL TECHNIQUES

WAFER ALIGNMENT SYSTEM WITH OPTICAL COHERENCE TOMOGRAPHY