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Yongdong Liu
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Cupertino, CA, US
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Patents Grants
last 30 patents
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Patent Grant
Scatterometry measurement of asymmetric structures
Patent number
8,525,993
Issue date
Sep 3, 2013
Nanometrics Incorporated
Silvio J. Rabello
G01 - MEASURING TESTING
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Patent Grant
Correction of optical metrology for focus offset
Patent number
7,450,225
Issue date
Nov 11, 2008
Nanometrics Incorporated
Zhuan Liu
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Scatterometry Measurement of Asymmetric Structures
Publication number
20110080585
Publication date
Apr 7, 2011
Nanometrics Incorporated
Silvio J. Rabello
G01 - MEASURING TESTING