YONGFENG CAO

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
Method for measuring interface state density
- Patent number 9,110,126
- Issue date Aug 18, 2015
- Shanghai Huali Microelectronics Corporation
- Yongfeng Cao
- G01 - MEASURING TESTING
Information Patent Grant
CML to CMOS conversion circuit
- Patent number 8,749,269
- Issue date Jun 10, 2014
- Shanghai Huali Microelectronics Corporation
- Yongfeng Cao
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR MEASURING INTERFACE STATE DENSITY
- Publication number 20130099799
- Publication date Apr 25, 2013
- YONGFENG CAO
- G01 - MEASURING TESTING
Information Patent Application
CML TO CMOS CONVERSION CIRCUIT
- Publication number 20130099822
- Publication date Apr 25, 2013
- YONGFENG CAO
- H03 - BASIC ELECTRONIC CIRCUITRY