Yonggang Huang

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Champaign, IL, US

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Patents Grantslast 30 patents

Information Patent Grant
Characterizing curvatures and stresses in thin-film structures on s...
- Patent number 7,966,135
- Issue date Jun 21, 2011
- California Institute of Technology
- Ares J. Rosakis
- G01 - MEASURING TESTING
Information Patent Grant
Measuring stresses in multi-layer thin film systems with variable f...
- Patent number 7,930,113
- Issue date Apr 19, 2011
- California Institute of Technology
- Yonggang Huang
- G01 - MEASURING TESTING
Information Patent Grant
Techniques and devices for characterizing spatially non-uniform cur...
- Patent number 7,487,050
- Issue date Feb 3, 2009
- California Institute of Technology
- Ares J. Rosakis
- G01 - MEASURING TESTING
Information Patent Grant
Techniques for analyzing non-uniform curvatures and stresses in thi...
- Patent number 7,363,173
- Issue date Apr 22, 2008
- California Institute of Technology
- Ares J. Rosakis
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Characterizing Curvatures and Stresses in Thin-Film Structures on S...
- Publication number 20070180919
- Publication date Aug 9, 2007
- California Institute of Technology
- Ares J. Rosakis
- G01 - MEASURING TESTING
Information Patent Application
Techniques and devices for characterizing spatially non-uniform cur...
- Publication number 20060276977
- Publication date Dec 7, 2006
- Ares J. Rosakis
- G01 - MEASURING TESTING
Information Patent Application
Techniques for analyzing non-uniform curvatures and stresses in thi...
- Publication number 20050278126
- Publication date Dec 15, 2005
- Ares J. Rosakis
- G01 - MEASURING TESTING