Yonghang Fu

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Plano, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for defect detection
- Patent number 7,539,583
- Issue date May 26, 2009
- Rudolph Technologies, Inc.
- Yonghang Fu
- G01 - MEASURING TESTING
Information Patent Grant
System and method for performing optical inspection utilizing diffr...
- Patent number 6,864,971
- Issue date Mar 8, 2005
- ISOA, Inc.
- YouLing Lin
- G01 - MEASURING TESTING
Information Patent Grant
System and method for detecting defects on a structure-bearing surf...
- Patent number 6,813,376
- Issue date Nov 2, 2004
- Rudolph Technologies, Inc.
- Kathleen Hennessey
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Method and system for defect detection
- Publication number 20060199287
- Publication date Sep 7, 2006
- Yonghang Fu
- G01 - MEASURING TESTING
Information Patent Application
System and method for performing optical inspection utilizing diffr...
- Publication number 20020140930
- Publication date Oct 3, 2002
- YouLin Lin
- G01 - MEASURING TESTING