Yongjin NA

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Daejeon, KR

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Patents Grantslast 30 patents

Information Patent Grant
Ultrafast camera system and measurement method thereof
- Patent number 11,902,495
- Issue date Feb 13, 2024
- Korea Advanced Institute of Science and Technology
- Jungwon Kim
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optical phase detector using electrical pulse that corresponds to a...
- Patent number 11,486,982
- Issue date Nov 1, 2022
- Korea Advanced Institute of Science and Technology
- Jungwon Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-channel optical phase detector, multi-channel sensing system...
- Patent number 11,469,848
- Issue date Oct 11, 2022
- Korea Advanced Institute of Science and Technology
- Jungwon Kim
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System for generating low-jitter digital clock signals using pulsed...
- Patent number 11,082,032
- Issue date Aug 3, 2021
- Korea Advanced Institute of Science and Technology
- Jungwon Kim
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
ULTRAFAST CAMERA SYSTEM AND MEASUREMENT METHOD THEREOF
- Publication number 20210377511
- Publication date Dec 2, 2021
- Korea Advanced Institute of Science and Technology
- Jungwon KIM
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR GENERATING LOW-JITTER DIGITAL CLOCK SIGNALS USING PULSED...
- Publication number 20200350898
- Publication date Nov 5, 2020
- Korea Advanced Institute of Science and Technology
- Jungwon Kim
- G01 - MEASURING TESTING
Information Patent Application
MULTI-CHANNEL OPTICAL PHASE DETECTOR, MULTI-CHANNEL SENSING SYSTEM...
- Publication number 20200266913
- Publication date Aug 20, 2020
- Korea Advanced Institute of Science and Technology
- Jungwon KIM
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PHASE DETECTOR USING ELECTRICAL PULSE, AND SENSING SYSTEM I...
- Publication number 20200264289
- Publication date Aug 20, 2020
- Korea Advanced Institute of Science and Technology
- Jungwon KIM
- G01 - MEASURING TESTING