Yongjun Zheng

Person

Hangzhou, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Addressable test chip
- Patent number 11,668,748
- Issue date Jun 6, 2023
- SEMITRONIX CORPORATION
- Fan Lan
- G01 - MEASURING TESTING
Information Patent Grant
Addressable test chip test system
- Patent number 10,254,339
- Issue date Apr 9, 2019
- SEMITRONIX CORPORATION
- Fan Lan
- G01 - MEASURING TESTING
Information Patent Grant
Addressable ring oscillator test chip
- Patent number 10,156,605
- Issue date Dec 18, 2018
- Semitronix Corporation
- Weiwei Pan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Addressable test circuit and test method for key parameters of tran...
- Patent number 9,817,058
- Issue date Nov 14, 2017
- SEMITRONIX CORPORATION
- Weiwei Pan
- G11 - INFORMATION STORAGE
Information Patent Grant
Programmable addressable test chip
- Patent number 9,646,900
- Issue date May 9, 2017
- SEMITRONIX CORPORATION
- Xu Ouyang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for testing a plurality of transistors in a target chip
- Patent number 9,146,270
- Issue date Sep 29, 2015
- SEMITRONIX CORPORATION
- Kangpeng Shao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ADDRESSABLE TEST CHIP
- Publication number 20220146573
- Publication date May 12, 2022
- Semitronix Corporation
- Fan LAN
- G01 - MEASURING TESTING
Information Patent Application
ADDRESSABLE TEST CHIP TEST SYSTEM
- Publication number 20180188324
- Publication date Jul 5, 2018
- Semitronix Corporation
- Fan LAN
- G01 - MEASURING TESTING
Information Patent Application
Addressable test circuit and test method for key parameters of tran...
- Publication number 20170059645
- Publication date Mar 2, 2017
- Semitronix Corporation
- WEIWEI PAN
- G01 - MEASURING TESTING
Information Patent Application
ADDRESSABLE RING OSCILLATOR TEST CHIP
- Publication number 20160061895
- Publication date Mar 3, 2016
- Semitronix Corporation
- Weiwei Pan
- G01 - MEASURING TESTING
Information Patent Application
PROGRAMMABLE ADDRESSABLE TEST CHIP
- Publication number 20150212144
- Publication date Jul 30, 2015
- Semitronix Corporation
- XU OUYANG
- G01 - MEASURING TESTING
Information Patent Application
Addressable test circuit and test method for key parameters of tran...
- Publication number 20150042372
- Publication date Feb 12, 2015
- Semitronix Corporation
- WEIWEI PAN
- G01 - MEASURING TESTING
Information Patent Application
Method for Testing a Plurality of Transistors in a Target Chip
- Publication number 20150002184
- Publication date Jan 1, 2015
- Semitronix Corporation
- Kangpeng Shao
- G01 - MEASURING TESTING
Information Patent Application
Method of Generating Parameterized Units
- Publication number 20140115547
- Publication date Apr 24, 2014
- Semitronix Corporation
- YONGJUN ZHENG
- G06 - COMPUTING CALCULATING COUNTING

Yongjun Zheng

Person

Patents Grantslast 30 patents

Addressable test chip

Addressable test chip test system

Addressable ring oscillator test chip

Addressable test circuit and test method for key parameters of tran...

Programmable addressable test chip

Method for testing a plurality of transistors in a target chip

Patents Applicationslast 30 patents

ADDRESSABLE TEST CHIP

ADDRESSABLE TEST CHIP TEST SYSTEM

Addressable test circuit and test method for key parameters of tran...

ADDRESSABLE RING OSCILLATOR TEST CHIP

PROGRAMMABLE ADDRESSABLE TEST CHIP

Addressable test circuit and test method for key parameters of tran...

Method for Testing a Plurality of Transistors in a Target Chip

Method of Generating Parameterized Units