Yongxin Wang

Person

San Ramon, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Cross-talk cancellation in multiple charged-particle beam inspection
- Patent number 12,080,513
- Issue date Sep 3, 2024
- ASML Netherlands B.V.
- Wei Fang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
MEMS image forming element with built-in voltage generator
- Patent number 12,030,772
- Issue date Jul 9, 2024
- ASML Netherlands B.V.
- Yongxin Wang
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Field programmable detector array
- Patent number 11,942,304
- Issue date Mar 26, 2024
- ASML Netherlands B.V.
- Yongxin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Switch matrix design for beam image system
- Patent number 11,862,427
- Issue date Jan 2, 2024
- ASML Netherlands B.V.
- Yongxin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-cell detector for charged particles
- Patent number 11,784,024
- Issue date Oct 10, 2023
- ASML Netherlands B.V.
- Joe Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Power supply system for electric vehicles
- Patent number 11,718,198
- Issue date Aug 8, 2023
- Yongxin Wang
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Method and apparatus for charged particle detection
- Patent number 11,715,619
- Issue date Aug 1, 2023
- ASML Netherlands B.V.
- Yongxin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pixel shape and section shape selection for large active area high...
- Patent number 11,594,395
- Issue date Feb 28, 2023
- ASML Netherlands B.V.
- Yongxin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor charged particle detector for microscopy
- Patent number 11,508,547
- Issue date Nov 22, 2022
- ASML Netherlands B.V.
- Yongxin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Calibrating user confidence in compliance with an organization's se...
- Patent number 11,481,709
- Issue date Oct 25, 2022
- Netskope, Inc.
- Yihua Liao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Switch matrix design for beam image system
- Patent number 11,476,085
- Issue date Oct 18, 2022
- ASML Netherlands B.V.
- Yongxin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reducing false detection of anomalous user behavior on a computer n...
- Patent number 11,444,951
- Issue date Sep 13, 2022
- Netskope, Inc.
- Dipak Patil
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Field programmable detector array
- Patent number 11,430,629
- Issue date Aug 30, 2022
- ASML Netherlands B.V.
- Yongxin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scoring confidence in user compliance with an organization's securi...
- Patent number 11,310,282
- Issue date Apr 19, 2022
- Netskope, Inc.
- Yi Zhang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for charged particle detection
- Patent number 11,295,930
- Issue date Apr 5, 2022
- ASML Netherlands B.V.
- Yongxin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-cell detector for charged particles
- Patent number 11,222,766
- Issue date Jan 11, 2022
- ASML Netherlands B.V.
- Joe Wang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
POWER SUPPLY SYSTEM FOR ELECTRIC VEHICLES
- Publication number 20240235332
- Publication date Jul 11, 2024
- Yongxin Wang
- B60 - VEHICLES IN GENERAL
Information Patent Application
ON SYSTEM SELF-DIAGNOSIS AND SELF-CALIBRATION TECHNIQUE FOR CHARGED...
- Publication number 20240186106
- Publication date Jun 6, 2024
- ASML NETHERLANDS B.V.
- Yongxin WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPERATION METHODS OF 2D PIXELATED DETECTOR FOR AN APPARATUS WITH PL...
- Publication number 20240079204
- Publication date Mar 7, 2024
- ASML NETHERLANDS B.V.
- Yongxin WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SENSING ELEMENT LEVEL CIRCUITRY DESIGN FOR ELECTRON COUNTING DETECT...
- Publication number 20230335372
- Publication date Oct 19, 2023
- ASML NETHERLANDS B.V.
- Yongxin WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POWER SUPPLY SYSTEM FOR ELECTRIC VEHICLES
- Publication number 20230331116
- Publication date Oct 19, 2023
- Yongxin Wang
- B60 - VEHICLES IN GENERAL
Information Patent Application
ENHANCED ARCHITECTURE FOR HIGH-PERFORMANCE DETECTION DEVICE TECHNIC...
- Publication number 20230215685
- Publication date Jul 6, 2023
- ASML NETHERLANDS B.V.
- Yongxin WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AN APPARATUS USING ENHANCED DEFLECTORS TO MANIPULATE CHARGED PARTIC...
- Publication number 20230178328
- Publication date Jun 8, 2023
- ASML NETHERLANDS B.V.
- Yongxin WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ENHANCED ARCHITECTURE FOR HIGH-PERFORMANCE DETECTION DEVICE
- Publication number 20230170179
- Publication date Jun 1, 2023
- ASML NETHERLANDS B.V.
- Yongxin WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR SIGNAL ELECTRON DETECTION
- Publication number 20230137186
- Publication date May 4, 2023
- ASML NETHERLANDS B.V.
- Weiming REN
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR CHARGED PARTICLE DETECTOR FOR MICROSCOPY
- Publication number 20230123152
- Publication date Apr 20, 2023
- ASML NETHERLANDS B.V.
- Yongxin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR SIGNAL ELECTRON DETECTION
- Publication number 20230112447
- Publication date Apr 13, 2023
- ASML NETHERLANDS B.V.
- Weiming REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SWITCH MATRIX DESIGN FOR BEAM IMAGE SYSTEM
- Publication number 20230005707
- Publication date Jan 5, 2023
- ASML NETHERLANDS B.V.
- Yongxin WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIELD PROGRAMMABLE DETECTOR ARRAY
- Publication number 20220415608
- Publication date Dec 29, 2022
- ASML NETHERLANDS B.V.
- Yongxin WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED-PARTICLE DETECTOR PACKAGE FOR HIGH SPEED APPLICATIONS
- Publication number 20220393057
- Publication date Dec 8, 2022
- ASML NETHERLANDS B.V.
- Yongxin WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR CHARGED PARTICLE DETECTION
- Publication number 20220375716
- Publication date Nov 24, 2022
- ASML NETHERLANDS B.V.
- Yongxin WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCORING CONFIDENCE IN USER COMPLIANCE WITH AN ORGANIZATION'S SECURI...
- Publication number 20220377111
- Publication date Nov 24, 2022
- Netskope, Inc.
- Yihua LIAO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
CROSS-TALK CANCELLATION IN MULTIPLE CHARGED-PARTICLE BEAM INSPECTION
- Publication number 20220301811
- Publication date Sep 22, 2022
- ASML NETHERLANDS B.V.
- Wei FANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-CELL DETECTOR FOR CHARGED PARTICLES
- Publication number 20220246391
- Publication date Aug 4, 2022
- ASML NETHERLANDS B.V.
- Joe WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PRINTED CIRCUIT BOARD FOR SEALING VACUUM SYSTEM
- Publication number 20220059311
- Publication date Feb 24, 2022
- ASML NETHERLANDS B.V.
- Yongxin WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME OF FLIGHT RANGING SYSTEM USING MULTI-VALUED SIGNALS
- Publication number 20210302588
- Publication date Sep 30, 2021
- Yongxin Wang
- G01 - MEASURING TESTING
Information Patent Application
POWER SUPPLY SYSTEM FOR ELECTRIC VEHICLES
- Publication number 20210245621
- Publication date Aug 12, 2021
- Yongxin Wang
- B60 - VEHICLES IN GENERAL
Information Patent Application
ARCHITECTURE FOR LARGE ACTIVE AREA HIGH SPEED DETECTOR
- Publication number 20210134557
- Publication date May 6, 2021
- ASML NETHERLANDS B.V.
- Yongxin WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PIXEL SHAPE AND SECTION SHAPE SELECTION FOR LARGE ACTIVE AREA HIGH...
- Publication number 20210043416
- Publication date Feb 11, 2021
- ASML Netherlands B.V.
- Yongxin WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMS IMAGE FORMING ELEMENT WITH BUILT-IN VOLTAGE GENERATOR
- Publication number 20200317504
- Publication date Oct 8, 2020
- ASML NETHERLANDS B.V.
- Yongxin WANG
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MULTI-CELL DETECTOR FOR CHARGED PARTICLES
- Publication number 20200286708
- Publication date Sep 10, 2020
- ASML NETHERLANDS B.V.
- Joe WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE DETECTOR WITH GAIN ELEMENT
- Publication number 20200273664
- Publication date Aug 27, 2020
- ASML NETHERLANDS B.V.
- Yongxin WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SWITCH MATRIX DESIGN FOR BEAM IMAGE SYSTEM
- Publication number 20200227229
- Publication date Jul 16, 2020
- ASML NETHERLANDS B.V.
- Yongxin WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIELD PROGRAMMABLE DETECTOR ARRAY
- Publication number 20200219696
- Publication date Jul 9, 2020
- ASML NETHERLANDS B.V.
- Yongxin WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR CHARGED PARTICLE DETECTION
- Publication number 20200027694
- Publication date Jan 23, 2020
- ASML NETHERLANDS B.V.
- Yongxin WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR CHARGED PARTICLE DETECTOR FOR MICROSCOPY
- Publication number 20190378682
- Publication date Dec 12, 2019
- ASML Netherlands B.V.
- Yongxin Wang
- G01 - MEASURING TESTING

Yongxin Wang

Person

Patents Grantslast 30 patents

Cross-talk cancellation in multiple charged-particle beam inspection

MEMS image forming element with built-in voltage generator

Field programmable detector array

Switch matrix design for beam image system

Multi-cell detector for charged particles

Power supply system for electric vehicles

Method and apparatus for charged particle detection

Pixel shape and section shape selection for large active area high...

Semiconductor charged particle detector for microscopy

Calibrating user confidence in compliance with an organization's se...

Switch matrix design for beam image system

Reducing false detection of anomalous user behavior on a computer n...

Field programmable detector array

Scoring confidence in user compliance with an organization's securi...

Method and apparatus for charged particle detection

Multi-cell detector for charged particles

Patents Applicationslast 30 patents

POWER SUPPLY SYSTEM FOR ELECTRIC VEHICLES

ON SYSTEM SELF-DIAGNOSIS AND SELF-CALIBRATION TECHNIQUE FOR CHARGED...

OPERATION METHODS OF 2D PIXELATED DETECTOR FOR AN APPARATUS WITH PL...

SENSING ELEMENT LEVEL CIRCUITRY DESIGN FOR ELECTRON COUNTING DETECT...

POWER SUPPLY SYSTEM FOR ELECTRIC VEHICLES

ENHANCED ARCHITECTURE FOR HIGH-PERFORMANCE DETECTION DEVICE TECHNIC...

AN APPARATUS USING ENHANCED DEFLECTORS TO MANIPULATE CHARGED PARTIC...

ENHANCED ARCHITECTURE FOR HIGH-PERFORMANCE DETECTION DEVICE

SYSTEMS AND METHODS FOR SIGNAL ELECTRON DETECTION

SEMICONDUCTOR CHARGED PARTICLE DETECTOR FOR MICROSCOPY

SYSTEMS AND METHODS FOR SIGNAL ELECTRON DETECTION

SWITCH MATRIX DESIGN FOR BEAM IMAGE SYSTEM

FIELD PROGRAMMABLE DETECTOR ARRAY

CHARGED-PARTICLE DETECTOR PACKAGE FOR HIGH SPEED APPLICATIONS

METHOD AND APPARATUS FOR CHARGED PARTICLE DETECTION

SCORING CONFIDENCE IN USER COMPLIANCE WITH AN ORGANIZATION'S SECURI...

CROSS-TALK CANCELLATION IN MULTIPLE CHARGED-PARTICLE BEAM INSPECTION

MULTI-CELL DETECTOR FOR CHARGED PARTICLES

PRINTED CIRCUIT BOARD FOR SEALING VACUUM SYSTEM

TIME OF FLIGHT RANGING SYSTEM USING MULTI-VALUED SIGNALS

POWER SUPPLY SYSTEM FOR ELECTRIC VEHICLES

ARCHITECTURE FOR LARGE ACTIVE AREA HIGH SPEED DETECTOR

PIXEL SHAPE AND SECTION SHAPE SELECTION FOR LARGE ACTIVE AREA HIGH...

MEMS IMAGE FORMING ELEMENT WITH BUILT-IN VOLTAGE GENERATOR

MULTI-CELL DETECTOR FOR CHARGED PARTICLES

CHARGED PARTICLE DETECTOR WITH GAIN ELEMENT

SWITCH MATRIX DESIGN FOR BEAM IMAGE SYSTEM

FIELD PROGRAMMABLE DETECTOR ARRAY

METHOD AND APPARATUS FOR CHARGED PARTICLE DETECTION

SEMICONDUCTOR CHARGED PARTICLE DETECTOR FOR MICROSCOPY