Yoojin JEONG

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Suwon-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Extreme ultraviolet (EUV) collector inspection apparatus and method
- Patent number 11,676,263
- Issue date Jun 13, 2023
- Samsung Electronics Co., Ltd.
- Dong-Hyub Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor substrate measuring apparatus and plasma treatment ap...
- Patent number 11,488,875
- Issue date Nov 1, 2022
- Samsung Electronics Co., Ltd.
- Junbum Park
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
- Publication number 20240292597
- Publication date Aug 29, 2024
- Samsung Electronics Co., Ltd.
- Junghwan HUH
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20240244830
- Publication date Jul 18, 2024
- Samsung Electronics Co., Ltd.
- Yoojin Jeong
Information Patent Application
EUV COLLECTOR INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20230108698
- Publication date Apr 6, 2023
- Samsung Electronics Co., Ltd.
- Jongbin Park
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
EXTREME ULTRAVIOLET (EUV) COLLECTOR INSPECTION APPARATUS AND METHOD
- Publication number 20220309643
- Publication date Sep 29, 2022
- Samsung Electronics Co., Ltd.
- Dong-Hyub Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR SUBSTRATE MEASURING APPARATUS AND PLASMA TREATMENT AP...
- Publication number 20210074594
- Publication date Mar 11, 2021
- Samsung Electronics Co., Ltd.
- Junbum PARK
- H01 - BASIC ELECTRIC ELEMENTS