Yoonna OH

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Seongnam-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Memory devices having variable repair units therein and methods of...
- Patent number 11,791,014
- Issue date Oct 17, 2023
- Samsung Electronics Co., Ltd.
- Yesin Ryu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory devices having variable repair units therein and methods of...
- Patent number 11,527,303
- Issue date Dec 13, 2022
- Samsung Electronics Co., Ltd.
- Yesin Ryu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor memory device capable of increasing flexibility of a...
- Patent number 11,508,456
- Issue date Nov 22, 2022
- Samsung Electronics Co., Ltd.
- Yesin Ryu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor memory devices and methods of operating semiconductor...
- Patent number 11,450,396
- Issue date Sep 20, 2022
- Samsung Electronics Co., Ltd.
- Kyungryun Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory devices and methods of operating semiconductor...
- Patent number 11,094,390
- Issue date Aug 17, 2021
- Samsung Electronics Co., Ltd.
- Kyungryun Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device including column redundancy
- Patent number 10,339,042
- Issue date Jul 2, 2019
- Samsung Electronics Co., Ltd.
- Yoonna Oh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of inspecting a mask
- Patent number 8,526,707
- Issue date Sep 3, 2013
- Samsung Electronics Co., Ltd.
- Yoonna Oh
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MEMORY DEVICES HAVING VARIABLE REPAIR UNITS THEREIN AND METHODS OF...
- Publication number 20230069753
- Publication date Mar 2, 2023
- Samsung Electronics Co., Ltd.
- Yesin Ryu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR MEMORY DEVICES AND METHODS OF OPERATING SEMICONDUCTOR...
- Publication number 20220020445
- Publication date Jan 20, 2022
- Samsung Electronics Co., Ltd.
- Kyungryun Kim
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICES HAVING VARIABLE REPAIR UNITS THEREIN AND METHODS OF...
- Publication number 20210124659
- Publication date Apr 29, 2021
- Samsung Electronics Co., Ltd.
- Yesin Ryu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR MEMORY DEVICES AND METHODS OF OPERATING SEMICONDUCTOR...
- Publication number 20210012849
- Publication date Jan 14, 2021
- Samsung Electronics Co., Ltd.
- Kyungryun Kim
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICES AND METHODS OF OPERATING SEMICONDUCTOR...
- Publication number 20200365226
- Publication date Nov 19, 2020
- Samsung Electronics Co., Ltd.
- Yesin Ryu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICE INCLUDING COLUMN REDUNDANCY
- Publication number 20180067847
- Publication date Mar 8, 2018
- Samsung Electronics Co., Ltd.
- YOONNA OH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VIRTUAL FAIL ADDRESS GENERATION SYSTEM, REDUNDANCY ANALYSIS SIMULAT...
- Publication number 20130311831
- Publication date Nov 21, 2013
- Samsung Electronics Co., Ltd.
- Yoonna Oh
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING A MASK
- Publication number 20110142325
- Publication date Jun 16, 2011
- SAMSUNG ELECTRONICS CO., LTD.
- Yoonna OH
- G06 - COMPUTING CALCULATING COUNTING

Person

Patents Grantslast 30 patents

Memory devices having variable repair units therein and methods of...

Memory devices having variable repair units therein and methods of...

Semiconductor memory device capable of increasing flexibility of a...

Semiconductor memory devices and methods of operating semiconductor...

Semiconductor memory devices and methods of operating semiconductor...

Memory device including column redundancy

Method of inspecting a mask

Patents Applicationslast 30 patents

MEMORY DEVICES HAVING VARIABLE REPAIR UNITS THEREIN AND METHODS OF...

SEMICONDUCTOR MEMORY DEVICES AND METHODS OF OPERATING SEMICONDUCTOR...

MEMORY DEVICES HAVING VARIABLE REPAIR UNITS THEREIN AND METHODS OF...

SEMICONDUCTOR MEMORY DEVICES AND METHODS OF OPERATING SEMICONDUCTOR...

SEMICONDUCTOR MEMORY DEVICES AND METHODS OF OPERATING SEMICONDUCTOR...

MEMORY DEVICE INCLUDING COLUMN REDUNDANCY

VIRTUAL FAIL ADDRESS GENERATION SYSTEM, REDUNDANCY ANALYSIS SIMULAT...

METHOD OF INSPECTING A MASK