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Yoonoh HAN
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Asan-si, KR
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last 30 patents
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Patent Grant
Test socket having a housing with clamping devices to connect the h...
Patent number
8,939,784
Issue date
Jan 27, 2015
Samsung Electronics Co., Ltd.
Sangki Lee
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
SEMICONDUCTOR CHIP PACKAGE TEST SOCKETS
Publication number
20130260592
Publication date
Oct 3, 2013
Samsung Electronics Co., LTD
Sangki LEE
G01 - MEASURING TESTING