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Yoram Saban
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Shoham, IL
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Patents Grants
last 30 patents
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Patent Grant
Methods and apparatus for wavefront manipulations and improved 3-D...
Patent number
8,319,975
Issue date
Nov 27, 2012
Nano-Or Technologies (Israel) Ltd.
Yoel Arieli
G01 - MEASURING TESTING
Information
Patent Grant
Spatial wavefront analysis and 3D measurement
Patent number
7,609,388
Issue date
Oct 27, 2009
ICOS Vision Systems NV
Yoel Arieli
G11 - INFORMATION STORAGE
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Patent Grant
System and method for inspecting an object using an acousto-optic d...
Patent number
7,528,940
Issue date
May 5, 2009
Applied Materials, Israel, Ltd.
Alexander Veis
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SPATIAL WAVEFRONT ANALYSIS AND 3D MEASUREMENT
Publication number
20110149298
Publication date
Jun 23, 2011
ICOS Vision Systems NV
Yoel Arieli
G01 - MEASURING TESTING
Information
Patent Application
Methods and apparatus for wavefront manipulations and improved 3-D...
Publication number
20100002950
Publication date
Jan 7, 2010
ICOS VISION SYSTEMS NV
Yoel Arieli
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR INSPECTING AN OBJECT USING AN ACOUSTO-OPTIC D...
Publication number
20080100830
Publication date
May 1, 2008
Applied Materials, Israel, Ltd.
Alexander Veis
G01 - MEASURING TESTING
Information
Patent Application
Spatial wavefront analysis and 3d measurement
Publication number
20050007603
Publication date
Jan 13, 2005
Yoel Arieli
G01 - MEASURING TESTING