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Yoram Schwarz
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Santa Clara, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Systems, devices, and methods for aligning a particle beam and perf...
Patent number
12,020,897
Issue date
Jun 25, 2024
PDF Solutions, Inc.
Indranil De
G01 - MEASURING TESTING
Information
Patent Grant
Systems, devices, and methods for aligning a particle beam and perf...
Patent number
11,605,526
Issue date
Mar 14, 2023
PDF Solutions, Inc.
Indranil De
G01 - MEASURING TESTING
Information
Patent Grant
Methods for aligning a particle beam and performing a non-contact e...
Patent number
11,328,899
Issue date
May 10, 2022
PDF Solutions, Inc.
Indranil De
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Combinatorial screening method and apparatus
Patent number
8,821,795
Issue date
Sep 2, 2014
Intermolecular, Inc.
Imran Hashim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Combinatorial screening methods and apparatus
Patent number
8,815,157
Issue date
Aug 26, 2014
Intermolecular, Inc.
Imran Hashim
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Method and apparatus for parallel testing of semiconductor devices
Patent number
8,768,643
Issue date
Jul 1, 2014
Intermolecular, Inc.
Yoram Schwarz
G05 - CONTROLLING REGULATING
Information
Patent Grant
Method and system of improved reliability testing
Patent number
8,683,420
Issue date
Mar 25, 2014
Intermolecular, Inc.
Yun Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for testing multiple coupons
Patent number
8,575,951
Issue date
Nov 5, 2013
Intermolecular, Inc.
Yoram Schwarz
G01 - MEASURING TESTING
Information
Patent Grant
Test management system
Patent number
8,219,349
Issue date
Jul 10, 2012
Intermolecular, Inc.
Yoram Schwarz
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SYSTEMS, DEVICES, AND METHODS FOR ALIGNING A PARTICLE BEAM AND PERF...
Publication number
20240304414
Publication date
Sep 12, 2024
PDF Solutions, Inc.
Indranil DE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEMS, DEVICES, AND METHODS FOR ALIGNING A PARTICLE BEAM AND PERF...
Publication number
20230282444
Publication date
Sep 7, 2023
PDF Solutions, Inc.
Indranil DE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEMS, DEVICES, AND METHODS FOR ALIGNING A PARTICLE BEAM AND PERF...
Publication number
20220336187
Publication date
Oct 20, 2022
PDF Solutions, Inc.
Indranil DE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEMS, DEVICES, AND METHODS FOR ALIGNING A PARTICLE BEAM AND PERF...
Publication number
20210098229
Publication date
Apr 1, 2021
Indranil DE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
COMBINATORIAL SCREENING METHODS AND APPARATUS
Publication number
20130053282
Publication date
Feb 28, 2013
Intermolecular, Inc.
Imran Hashim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR TESTING MULTIPLE COUPONS
Publication number
20120293162
Publication date
Nov 22, 2012
Intermolecular, Inc.
Yoram Schwarz
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR PARALLEL TESTING OF SEMICONDUCTOR DEVICES
Publication number
20120290245
Publication date
Nov 15, 2012
Intermolecular, Inc.
Yoram Schwarz
G05 - CONTROLLING REGULATING
Information
Patent Application
Method and System of Improved Reliability Testing
Publication number
20120119768
Publication date
May 17, 2012
Yun Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Combinatorial Screening Method and Apparatus
Publication number
20100048419
Publication date
Feb 25, 2010
Imran Hashim
H01 - BASIC ELECTRIC ELEMENTS