Yorinobu Kunimune

Person

Kanagawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device
- Patent number 10,074,740
- Issue date Sep 11, 2018
- Renesas Electronics Corporation
- Hideaki Tsuchiya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 9,722,066
- Issue date Aug 1, 2017
- Renesas Electronics Corporation
- Hideaki Tsuchiya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 9,356,110
- Issue date May 31, 2016
- Renesas Electronics Corporation
- Masao Inoue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 9,293,457
- Issue date Mar 22, 2016
- Renesas Electronics Corporation
- Hideaki Tsuchiya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for manufacturing same
- Patent number 7,846,830
- Issue date Dec 7, 2010
- NEC Electronics Corporation
- Toshiyuki Takewaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for manufacturing same
- Patent number 7,687,918
- Issue date Mar 30, 2010
- NEC Electronics Corporation
- Yorinobu Kunimune
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having an anti-oxidizing layer that inhibits c...
- Patent number 7,312,535
- Issue date Dec 25, 2007
- NEC Electronics Corporation
- Toshiyuki Takewaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning probe inspection apparatus
- Patent number 7,309,991
- Issue date Dec 18, 2007
- NEC Electronics Corporation
- Yorinobu Kunimune
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20250046705
- Publication date Feb 6, 2025
- RENESAS ELECTRONICS CORPORATION
- Nobuhito SHIRAISHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RESISTOR MATERIAL, RESISTOR ELEMENT AND METHOD OF MANUFACTURING THE...
- Publication number 20230116260
- Publication date Apr 13, 2023
- RENESAS ELECTRONICS CORPORATION
- Nozomi ITO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20170301782
- Publication date Oct 19, 2017
- Renesas Electronics Corporation
- Hideaki Tsuchiya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20160181411
- Publication date Jun 23, 2016
- Renesas Electronics Corporation
- Hideaki Tsuchiya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20160020207
- Publication date Jan 21, 2016
- RENESAS ELECTRONICS CORPORATION
- Hideaki Tsuchiya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20140312406
- Publication date Oct 23, 2014
- RENESAS ELECTRONICS CORPORATION
- Masao INOUE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method for manufacturing same
- Publication number 20080044997
- Publication date Feb 21, 2008
- Toshiyuki Takewaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning probe inspection apparatus
- Publication number 20060119373
- Publication date Jun 8, 2006
- NEC ELECTRONICS CORPORATION
- Yorinobu Kunimune
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and method for manufacturing same
- Publication number 20040188851
- Publication date Sep 30, 2004
- NEC Electronics Corporation
- Toshiyuki Takewaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method for manufacturing same
- Publication number 20040130030
- Publication date Jul 8, 2004
- NEC Electronics Corporation
- Yorinobu Kunimune
- H01 - BASIC ELECTRIC ELEMENTS

Yorinobu Kunimune

Person

Patents Grantslast 30 patents

Semiconductor device

Semiconductor device

Semiconductor device and manufacturing method thereof

Semiconductor device

Semiconductor device and method for manufacturing same

Semiconductor device and method for manufacturing same

Semiconductor device having an anti-oxidizing layer that inhibits c...

Scanning probe inspection apparatus

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

RESISTOR MATERIAL, RESISTOR ELEMENT AND METHOD OF MANUFACTURING THE...

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

Semiconductor device and method for manufacturing same

Scanning probe inspection apparatus

Semiconductor device and method for manufacturing same

Semiconductor device and method for manufacturing same