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Yosef Basson
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Holon, IL
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Patents Grants
last 30 patents
Information
Patent Grant
Evaluating a contact between a wafer and an electrostatic chuck
Patent number
11,694,869
Issue date
Jul 4, 2023
Applied Materials Israel Ltd.
Adam Faust
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Detection of an electric arc hazard related to a wafer
Patent number
11,293,993
Issue date
Apr 5, 2022
Applied Materials Israel Ltd.
Yosef Basson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Compensating for an electromagnetic interference induced deviation...
Patent number
11,276,545
Issue date
Mar 15, 2022
Applied Materials Israel Ltd.
Yosef Basson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High voltage electron beam system and method
Patent number
9,911,571
Issue date
Mar 6, 2018
Applied Materials Israel Ltd.
Yosef Basson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Magnetoelectronic devices based on colossal magnetoresistive thin f...
Patent number
7,684,147
Issue date
Mar 23, 2010
Charles Ahn
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
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Patent Application
DISCHARGING AN ELECTROSTATIC CHUCK LOCATED WITHIN A VACUUM CHAMBER
Publication number
20240234078
Publication date
Jul 11, 2024
APPLIED MATERIALS ISRAEL LTD.
Adam Faust
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
EVALUATING A CONTACT BETWEEN A WAFER AND AN ELECTROSTATIC CHUCK
Publication number
20220181115
Publication date
Jun 9, 2022
APPLIED MATERIALS ISRAEL LTD.
Adam Faust
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DETECTION OF AN ELECTRIC ARC HAZARD RELATED TO A WAFER
Publication number
20210063461
Publication date
Mar 4, 2021
APPLIED MATERIALS ISRAEL LTD.
Yosef Basson
G01 - MEASURING TESTING
Information
Patent Application
HIGH VOLTAGE ELECTRON BEAM SYSTEM AND METHOD
Publication number
20170309442
Publication date
Oct 26, 2017
APPLIED MATERIALS ISRAEL LTD.
Yosef Basson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Magnetoelectronic devices based on colossal magnetoresistive thin f...
Publication number
20070096228
Publication date
May 3, 2007
Charles Ahn
G01 - MEASURING TESTING