Yoshiaki Akama

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Temperature measuring method and apparatus, measuring method for th...
- Patent number 6,780,657
- Issue date Aug 24, 2004
- Kabushiki Kaisha Toshiba
- Tomomi Ino
- G01 - MEASURING TESTING
Information Patent Grant
Temperature measuring method and apparatus, measuring method for th...
- Patent number 6,541,287
- Issue date Apr 1, 2003
- Kabushiki Kaisha Toshiba
- Tomomi Ino
- G01 - MEASURING TESTING
Information Patent Grant
Device for emitting electrons
- Patent number 5,903,092
- Issue date May 11, 1999
- Kabushiki Kaisha Toshiba
- Yoshiaki Akama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compact display device
- Patent number 5,679,960
- Issue date Oct 21, 1997
- Kabushiki Kaisha Toshiba
- Yoshiaki Akama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for manufacturing needle shaped materials and...
- Patent number 5,509,843
- Issue date Apr 23, 1996
- Kabushiki Kaisha Toshiba
- Yoshiaki Akama
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Temperature measuring method and apparatus, measuring method for th...
- Publication number 20020192847
- Publication date Dec 19, 2002
- Kabushiki Kaisha Toshiba
- Tomomi Ino
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE MEASURING METHOD AND APPARATUS, MEASURING MEHTOD FOR TH...
- Publication number 20020066859
- Publication date Jun 6, 2002
- TOMOMI INO
- G01 - MEASURING TESTING