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Yoshiaki NAGASHIMA
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Hitachi, JP
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Patents Grants
last 30 patents
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Patent Grant
Model creation method and device, and inspection device using the same
Patent number
10,429,357
Issue date
Oct 1, 2019
Hitachi, Ltd.
Hirohisa Mizota
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Nondestructive inspection apparatus and nondestructive inspection m...
Patent number
8,820,163
Issue date
Sep 2, 2014
Hitachi-GE Nuclear Energy, Ltd.
Masahiro Miki
G01 - MEASURING TESTING
Information
Patent Grant
Nondestructive inspection apparatus and nondestructive inspection m...
Patent number
8,091,427
Issue date
Jan 10, 2012
Hitachi-GE Nuclear Energy, Ltd.
Masahiro Miki
G01 - MEASURING TESTING
Information
Patent Grant
Nondestructive inspection apparatus and nondestructive inspection m...
Patent number
7,171,854
Issue date
Feb 6, 2007
Hitachi, Ltd.
Yoshiaki Nagashima
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring thickness of layer using acousti...
Patent number
5,663,502
Issue date
Sep 2, 1997
Hitachi, Ltd.
Yoshiaki Nagashima
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MODEL CREATION METHOD AND DEVICE, AND INSPECTION DEVICE USING THE SAME
Publication number
20160320352
Publication date
Nov 3, 2016
Hitachi, Ltd
Hirohisa MIZOTA
G01 - MEASURING TESTING
Information
Patent Application
NONDESTRUCTIVE INSPECTION APPARATUS AND NONDESTRUCTIVE INSPECTION M...
Publication number
20110308316
Publication date
Dec 22, 2011
HITACHI-GE NUCLEAR ENERGY, LTD.
Masahiro MIKI
G01 - MEASURING TESTING
Information
Patent Application
NONDESTRUCTIVE INSPECTION APPARATUS AND NONDESTRUCTIVE INSPECTION M...
Publication number
20090031813
Publication date
Feb 5, 2009
Masahiro MIKI
G01 - MEASURING TESTING
Information
Patent Application
Nondestructive inspection apparatus and nondestructive inspection m...
Publication number
20040255678
Publication date
Dec 23, 2004
Yoshiaki Nagashima
G01 - MEASURING TESTING