Yoshiaki Ogiso

Person

Otaru, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Pattern inspection apparatus and method
- Patent number 8,809,778
- Issue date Aug 19, 2014
- Advantest Corp.
- Ryuichi Ogino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect review apparatus and defect review method
- Patent number 8,779,359
- Issue date Jul 15, 2014
- Advantest Corp.
- Yoshiaki Ogiso
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mask inspection apparatus and mask inspection method
- Patent number 8,675,948
- Issue date Mar 18, 2014
- Advantest Corp.
- Yoshiaki Ogiso
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Mask inspection apparatus and image generation method
- Patent number 8,559,697
- Issue date Oct 15, 2013
- Advantest Corp.
- Tsutomu Murakawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Pattern measurement apparatus and pattern measurement method
- Patent number 8,507,858
- Issue date Aug 13, 2013
- Advantest Corp.
- Hiroshi Fukaya
- G01 - MEASURING TESTING
Information Patent Grant
Pattern measuring apparatus and pattern measuring method
- Patent number 8,431,895
- Issue date Apr 30, 2013
- Advantest Corp.
- Jun Matsumoto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Mask inspection apparatus and image creation method
- Patent number 8,071,943
- Issue date Dec 6, 2011
- Advantest Corp.
- Tsutomu Murakawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Image detection method and length measurement apparatus
- Patent number 6,546,154
- Issue date Apr 8, 2003
- Advantest Corporation
- Yoshiaki Ogiso
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Voltage and displacement measuring apparatus and probe
- Patent number 5,999,005
- Issue date Dec 7, 1999
- Fujitsu Limited
- Akira Fujii
- G01 - MEASURING TESTING
Information Patent Grant
Voltage and displacement measuring apparatus and probe
- Patent number 5,677,635
- Issue date Oct 14, 1997
- Fujitsu Limited
- Akira Fujii
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PATTERN INSPECTION APPARATUS AND METHOD
- Publication number 20130234020
- Publication date Sep 12, 2013
- Ryuichi Ogino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN MEASUREMENT APPARATUS AND PATTERN MEASUREMENT METHOD
- Publication number 20130105691
- Publication date May 2, 2013
- Advantest Corporation
- Hiroshi Fukaya
- G01 - MEASURING TESTING
Information Patent Application
Defect review apparatus and defect review method
- Publication number 20120112066
- Publication date May 10, 2012
- Yoshiaki Ogiso
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Mask inspection apparatus and image generation method
- Publication number 20110249885
- Publication date Oct 13, 2011
- Tsutomu Murakawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Mask inspection apparatus and mask inspection method
- Publication number 20110249108
- Publication date Oct 13, 2011
- Yoshiaki Ogiso
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Pattern measuring apparatus and pattern measuring method
- Publication number 20110049362
- Publication date Mar 3, 2011
- Jun Matsumoto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Mask inspection apparatus and image creation method
- Publication number 20100196804
- Publication date Aug 5, 2010
- Tsutomu Murakawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Image detection method and length measurement apparatus
- Publication number 20020186896
- Publication date Dec 12, 2002
- Yoshiaki Ogiso
- G06 - COMPUTING CALCULATING COUNTING

Yoshiaki Ogiso

Person

Patents Grantslast 30 patents

Pattern inspection apparatus and method

Defect review apparatus and defect review method

Mask inspection apparatus and mask inspection method

Mask inspection apparatus and image generation method

Pattern measurement apparatus and pattern measurement method

Pattern measuring apparatus and pattern measuring method

Mask inspection apparatus and image creation method

Image detection method and length measurement apparatus

Voltage and displacement measuring apparatus and probe

Voltage and displacement measuring apparatus and probe

Patents Applicationslast 30 patents

PATTERN INSPECTION APPARATUS AND METHOD

PATTERN MEASUREMENT APPARATUS AND PATTERN MEASUREMENT METHOD

Defect review apparatus and defect review method

Mask inspection apparatus and image generation method

Mask inspection apparatus and mask inspection method

Pattern measuring apparatus and pattern measuring method

Mask inspection apparatus and image creation method

Image detection method and length measurement apparatus