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Yoshiaki Sakagami
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Shiga, JP
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Patents Grants
last 30 patents
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Patent Grant
Foreign-matter detector and foreign-matter detecting system
Patent number
6,636,827
Issue date
Oct 21, 2003
ISHIDA CO., LTD.
Yoshiaki Sakagami
G01 - MEASURING TESTING
Information
Patent Grant
Weight checking apparatus
Patent number
6,553,331
Issue date
Apr 22, 2003
ISHIDA CO., LTD.
Yoshiaki Sakagami
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
X-RAY INSPECTION APPARATUS
Publication number
20240288592
Publication date
Aug 29, 2024
ISHIDA CO., LTD.
Futoshi YURUGI
G01 - MEASURING TESTING
Information
Patent Application
X-RAY INSPECTION DEVICE
Publication number
20240219324
Publication date
Jul 4, 2024
ISHIDA CO., LTD.
Futoshi YURUGI
G01 - MEASURING TESTING
Information
Patent Application
X-RAY INSPECTION APPARATUS AND ARTICLE HANDLING SYSTEM
Publication number
20230288347
Publication date
Sep 14, 2023
ISHIDA CO., LTD.
Kazuyuki Sugimoto
G01 - MEASURING TESTING
Information
Patent Application
WEIGHING APPARATUS
Publication number
20110196877
Publication date
Aug 11, 2011
ISHIDA CO., LTD.
Yoshiaki Sakagami
G01 - MEASURING TESTING