Yoshiaki Sasaki

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Wako-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Optical interference measuring apparatus and optical interference m...
- Patent number 12,000,699
- Issue date Jun 4, 2024
- Topcon Corporation
- Homare Momiyama
- G01 - MEASURING TESTING
Information Patent Grant
Enclosure inspection method and apparatus thereof
- Patent number 7,697,745
- Issue date Apr 13, 2010
- Riken
- Chiko Otani
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL INTERFERENCE MEASURING APPARATUS AND OPTICAL INTERFERENCE M...
- Publication number 20220228850
- Publication date Jul 21, 2022
- TOPCON CORPORATION
- Homare MOMIYAMA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INTERFERENCE MEASURING APPARATUS AND OPTICAL INTERFERENCE M...
- Publication number 20220221266
- Publication date Jul 14, 2022
- TOPCON CORPORATION
- Homare MOMIYAMA
- G01 - MEASURING TESTING
Information Patent Application
Enclosure inspection method and apparatus thereof
- Publication number 20070009085
- Publication date Jan 11, 2007
- Chiko Otani
- G01 - MEASURING TESTING